The HP/Agilent 54616B is a two-channel oscilloscope with 500 MHz bandwidth and 2 GSa/s sample rate, delivering real-time waveform capture and analysis for electronic test and troubleshooting. This instrument bridges analog oscilloscope intuition with digital measurement power, offering pre-trigger viewing, automatic parameter scaling, and flexible impedance selection for both high-frequency and general-purpose measurements.
Technical Specifications
• Bandwidth: 500 MHz
• Number of Channels: 2
• Sample Rate: 2 GSa/s
• Peak Detect: 1 ns
• Single-shot Bandwidth: 500 MHz
• Sweep Speeds: 1 ns/div to 5 s/div
• Horizontal Accuracy: ±0.005%
• Horizontal Resolution: 20 ps
• Input Impedance: Selectable 50 Ω or 1 MΩ
• Input Coupling: DC, AC, Ground
• Maximum Input: 400 V (dc + peak ac)
• Vertical Sensitivity: 1 mV/div to 5 V/div
• Vertical Accuracy: ±1.5%
• Display: Real-time vector display with variable intensity
– Key Features
• Autoscale function automatically optimizes voltage, time, and trigger settings
• One-button waveform storage and recall
• Pre-trigger event capture to view signals before the trigger point
• Automatic measurements: voltage (Vamp, Vavg, Vrms, Vpp, Vpre, Vovr, Vtop, Vbase, Vmin, Vmax) and time parameters (Delay, Duty Cycle, Frequency)
• Cursor-based manual measurements for detailed analysis
• Selectable 50 Ω input for minimized reflections in high-frequency applications; 1 MΩ input for general-purpose probe-based measurements
• Overvoltage protection on 50 Ω internal load
– Typical Applications
General-purpose signal analysis, electronic circuit troubleshooting, component characterization, and time-domain waveform measurement across RF and baseband frequencies.
– Compatibility & Integration
Optional interface modules support HP-IB (HP 54657A) and RS-232/parallel interfaces (HP 54659B) for remote control and hardcopy output. Measurement and storage modules enable unattended monitoring and FFT analysis. BenchLink software facilitates waveform image and data transfer to PC platforms for post-acquisition analysis and documentation.


















