The HP/Agilent 83624A is a synthesized sweeper delivering signal generation across 2 to 20 GHz with +20 dBm maximum leveled output power. Built for RF and microwave test environments, this instrument combines broadband frequency coverage with indirect synthesis architecture to achieve low single-sideband phase noise of -76 dBc at 10 kHz offset (20 GHz). Standard 1 kHz frequency resolution steps down to 1 Hz with Option 008, supporting three discrete frequency bands with switching times from 5 ms (within-band steps ≤100 MHz) to 70 ms maximum across band boundaries.
Technical Specifications
Frequency & Timing
• Frequency Range: 2 to 20 GHz
• Frequency Resolution: 1 kHz (standard); 1 Hz (Option 008)
• Band 1: 2.0 to <7 GHz | Band 2: 7 to 80 dB on/off ratio; <10 ns rise/fall times (Option 006); 300 ns to 400 ms period; 25 ns resolution
• Amplitude Modulation: 100%/V linear or 10 dB/V scan; up to 99.7% depth (50 dB)
• Frequency Modulation: ±8 MHz max deviation; rates to 8 MHz
Environmental
• Operating Temperature: 0 to 55°C
– Key Features
• Precise 1 Hz frequency resolution enables fine-grained tuning in demanding measurement scenarios
• Fast switching within frequency bands (5 ms for steps ≤100 MHz) accelerates test sequences
• Decoupled AM and FM capabilities allow simultaneous, independent modulation
• Phase noise floor of -76 dBc at 10 kHz supports sensitive receiver characterization
– Typical Applications
• Component and subsystem characterization across X, Ku, and K bands
• Transmitter and receiver testing with configurable power and modulation
• System integration and benchtop RF measurement
– Compatibility & Integration
The 83624A integrates standard swept architecture with option-based enhancements (Option 001 for leveled output; Option 006 for fast pulse edges; Option 008 for 1 Hz resolution). Internal time base accuracy and stability meet precision test requirements without external references.
