The HP/Agilent 8472B is a low-barrier Schottky diode detector engineered for precision RF power measurements across 10 MHz to 18 GHz. This detector operates without DC bias and connects directly to standard oscilloscopes, delivering accurate signal monitoring and power assessment in both CW and pulsed signal environments.
The 8472B employs a low-barrier Schottky diode with minimal junction capacitance and low series resistance, achieving superior broadband flatness and SWR performance compared to conventional point-contact detectors. Frequency response holds ±0.3 dB to 12.4 GHz, ±0.5 dB to 15 GHz, and ±0.6 dB to 18 GHz, with octave flatness of ±0.2 dB over any octave from 10 MHz to 8 GHz. SWR remains bounded at 1.15 from 10 MHz to 4 GHz, 1.35 to 7 GHz, 1.5 to 12.4 GHz, and 1.7 to 18 GHz.
Sensitivity exceeds 0.5 mV/µW at low levels, extending to >0.1 mV/µW with Option 002 matched load resistor. The detector sustains 200 mW continuous input power, with short-term capability to 1 W (0.5 mV/µW
• Sensitivity with Option 002: >0.1 mV/µW
• Maximum Input Power: 200 mW continuous; 1 W short-term (<1 minute)
• Noise: <50 µV
• Output Polarity: Negative (standard); Option 003 for positive
• Connectors: SMA male input, BNC female output
• Temperature: −20 °C to +85 °C
• Vibration: 20 G (80–2000 Hz); Shock: 100 G (11 ms)
• Weight: 57 g
– Key Features
• Low-barrier Schottky diode architecture with minimal series resistance and junction capacitance
• Bias-free operation compatible with standard oscilloscopes
• Option 001: Matched detector pair with ±0.2 dB tracking (10 MHz–12.4 GHz) and ±0.3 dB (12.4–18 GHz)
• Option 002: Video load extends square-law region to 0.1 mW (−10 dBm)
• Option 100: Female OSSM-type output connector
– Typical Applications
• CW and pulsed power detection
• Sweeper leveling
• Frequency response testing of microwave components
• Power sensing in microwave systems
– Compatibility & Integration
Designed for 50 Ω coaxial systems. SMA male input accommodates standard RF connectors; BNC female output interfaces with measurement instruments and data acquisition systems.
