The HP/Agilent 8719D is a high-performance vector network analyzer delivering precise S-parameter characterization across 50 MHz to 40 GHz. Built around a fully synthesized fast-sweeping source, integrated vector receiver, and solid-state S-parameter test set, this instrument measures magnitude, phase, group delay, insertion loss, and impedance with dynamic range up to 105 dB. The 1 Hz frequency resolution and 10 ppm accuracy support demanding RF and microwave component validation in telecommunications, aerospace, defense, and research environments.
Technical Specifications
Frequency & Source Performance
• Frequency range: 50 MHz to 40 GHz (depending on model variant)
• Frequency resolution: 1 Hz
• Frequency accuracy: 10 ppm
• Synthesized source with fast sweep capability
• Standard source power: +5 dBm; with Option 007: 0 dBm (≤20 GHz), -5 dBm (>20 GHz)
• Minimum source power: -70 dBm to -75 dBm (depending on variant)
• Power resolution: 0.01 dB
• Power flatness: ±1.5 dB (standard), ±2 dB (up to 40 GHz)
• Power sweep range: 20 dB
• Dynamic range (with response/isolation or full two-port calibration): Up to 105 dB (103 dB on some variants)
Measurement & Receiver Architecture
• S-parameter measurement: magnitude, phase, group delay
• Vector receiver with tuned receivers and variable bandwidth IF filters
• Measurement rate: <2 ms/point (1-port cal) to <5 ms/point (full 2-port cal)
• Built-in vector accuracy enhancement and full two-port calibration
• Time domain capability available (Option 010)
Physical & Connectivity
• Dimensions: 222 mm H × 425 mm W × 457 mm D
• Test port connectors: 3.5 mm (≤20 GHz models), 2.4 mm (40 GHz models)
• HP-IB interface (full protocol support)
– Key Features
• Integrated solid-state switching S-parameter test set eliminates external components
• Up to 31 nonvolatile memory registers for test data storage
• Built-in 3.5-inch disk drive for configuration and measurement archiving
• Test sequencing for external device control and measurement automation
• Mechanical Transfer Switch option (007) for increased output power
• High-Power Test Set option (085) available
• Direct Sampler Access option (012) for advanced measurements
– Typical Applications
• Component and subsystem characterization (filters, amplifiers, mixers)
• Transmission line and interconnect validation
• Antenna and array measurement
• Active device and module testing
• Impedance and reflection coefficient analysis
– Compatibility & Integration
HP-IB control enables seamless integration into automated test systems. Faster data transfer rates with internal processor acceleration support high-throughput production and characterization environments.
