The Interface Technology SR5020 TTL I/O Module is a high-density digital I/O interface for the SR5000 Digital Test Subsystem, delivering 32 stimulus and 32 response channels per module with 100 ps edge placement resolution. It integrates dual processors—a 68030 System Processor for VXI Bus communication and a Control Processor for real-time digital test functions including conditional branching, looping, and logic analysis triggering. The module scales to 640 total I/O pins when up to 20 SR5020 units are controlled by a single SR5010 Timing/Control Module.
## Technical Specifications
**I/O Architecture**
• 32 stimulus pins and 32 response pins per module
• 7 memory banks, each 64K vectors deep
• All memory banks operate at up to 50 MHz data rates
• Up to 20 modules supported per SR5010 controller (640 total pins)
**Timing and Edge Control**
• Edge placement resolution: 100 ps
• 16 timing generators per module
• 8 stimulus timing generator sets (2 pairs per 8-pin group)
• 2 response timing generators per module with window compare and glitch detection
**Data Formats and Pattern Support**
• Stimulus formats: NRZ, RZ, R1, RC, RI
• RAM-backed and algorithmic pattern generation
• 16-bit CCITT CRC signature analysis on input channels
• Mask memory for selective pattern comparison
**Power Consumption**
• +5.0 V: 10.0 A (50 W at 50 MHz; 7.5 A / 37.5 W at 40 MHz)
• −5.2 V: 4.0 A (20.8 W)
## Key Features
• Dual-processor architecture separates VXI bus communication from real-time test execution
• Conditional test logic enables dynamic test sequences without host intervention
• Seven independent memory banks support complex stimulus/response scenarios
• Nanosecond-class timing resolution suits memory, bus emulation, and functional test applications
## Typical Applications
Bus emulation, memory device testing, functional test of TTL-compatible circuits, digital signal stimulus and capture, and signature analysis.
## Compatibility & Integration
Designed for the SR5000 Digital Test Subsystem architecture. Integrates with SR5010 Timing/Control Module for multi-module scaling and centralized test sequencing.
