The JDS Uniphase MAP-280 is a modular optical test platform engineered for characterization of optical components and subsystems across research, development, and manufacturing environments. This rackmountable system emphasizes flexibility through hot-swappable instrumentation cassettes and scalable architecture. The platform integrates multiple specialized test modules within a common chassis, supporting applications in optical communications technology.
## Technical Specifications
**Mainframe Options:**
• MAP Master Chassis (MAP+2M00): 19-inch rackmountable mainframe with 8-slot capacity for extensive module integration. Dimensions: 44.91 cm (W) × 13.24 cm (H) × 52.37 cm (D). Features hot-swappable cassette support, color display, dynamic firmware, and automatic cassette identification. Front/rear reversible access. Field-replaceable controller, power supply, keypad/display, and remote interface modules.
• MAP Benchtop (MAP+2B00): Compact 9.5-inch, 3-slot mainframe for reduced instrumentation setups.
• MAP-230B: 3-slot modular platform with USB, GPIB, and Ethernet interfaces. PowerPC architecture with Linux OS. USB host ports support external device connectivity.
**Power Requirements:**
• Input voltage: 100 to 125 V AC at 50/60 Hz; 200 to 240 V AC at 50/60 Hz
• Power consumption: Approximately 200 VA (Master, Slave, and Benchtop configurations)
## Key Features
**Optical Amplifier Modules (EDFA):**
• Multiple configurations: pre-amplifier, booster, booster-high power, mid-span access booster, in-line, and booster-DWDM
• Saturated output power: 14 dBm to 21 dBm
• Noise figure: as low as 3.3 dB
• Gain flatness: better than 1.4 dB
• C-band or L-band operation available
**Light Source Modules:**
• ASE Broadband Source: Flattened high power density across C-band or C+L-band with high spectral stability
• DFB Laser Cassette: Tunable wavelength 1527 to 1610 nm for C- and L-band DWDM system testing. 50 GHz ITU grid compliance. Side-mode suppression ratio: 40 dB minimum
## Compatibility & Integration
The platform supports over 15 different hot-swappable instrumentation cassette types, enabling broad optical testing and measurement capability. ActiveX console and drivers with simulation mode support field configuration and remote operation.
