The MAP200-MOSW-C112E008BS-M100-MFA is an optical switching module within the JDS Uniphase MAP-200 modular platform, engineered for automated signal routing in optical test and measurement systems. This hot-swappable cassette delivers high-reliability optical switching with low insertion loss and exceptional repeatability—critical requirements for accurate IL, RL, and dispersion penalty measurements across single-mode and multimode fiber installations.
## Technical Specifications
The mOSW-C1 series switching module integrates into the MAP-200 platform, which supports up to 16 interchangeable instrumentation cassettes in either a 3-slot benchtop or 19-inch 8-slot rackmount chassis (all 3U height). System connectivity includes USB, GPIB, and Ethernet (LXI Class C compliant) interfaces with color display and 9-key keypad control.
Optical switch performance is characterized by cycle counts exceeding 100 million cycles without specification degradation. Insertion loss remains low and repeatable, ensuring stable measurements essential for bidirectional and complex multi-switch test architectures.
## Key Features
• Hot-swappable design enables rapid module reconfiguration
• High switch cycle count (>100 million) preserving long-term measurement accuracy
• Low insertion loss with high repeatability for IL measurement stability
• Supports automated bidirectional testing configurations
• Up to two switches can be deployed within a single platform for complex signal routing
• Compatible with both single-mode and multimode fiber types
## Typical Applications
• Insertion Loss (IL) and Return Loss (RL) testing
• Dispersion Penalty measurement
• Physical length and polarity verification of optical connectivity products
• Dense Wavelength Division Multiplexing (DWDM) test applications
• Single-mode fiber testing (all wavelength windows)
• Multimode fiber qualification (OM1, OM2, OM3, OM4)
## Compatibility & Integration
The module operates within the MAP-200 platform ecosystem, compatible with benchtop and rackmount configurations. Platform-level interfaces (USB, GPIB, Ethernet LXI) enable integration into automated test environments and manufacturing workflows.
