The JDS Uniphase MAPS+1K18204L1FP is a dual 1×4 optical switch module designed for integration into the JDS Uniphase Multiple Application Platform (MAP) system. This hot-swappable cassette delivers independent switching control across two 1×4 channels, enabling flexible optical signal routing for test and measurement applications across the 850 nm to 1350 nm wavelength band. The module combines low insertion loss with high return loss and excellent crosstalk isolation, making it suitable for demanding multiwavelength testing environments in optical research, device characterization, and manufacturing quality assurance.
## Technical Specifications
• **Switch Configuration:** Dual 1×4 (two independent 1×4 switches)
• **Wavelength Range:** 850 nm to 1350 nm
• **Insertion Loss:** 0.4 dB typical / 0.6 dB maximum
• **Return Loss:** 25 dB typical / 20 dB maximum
• **Insertion Loss Stability:** ±0.02 dB typical / ±0.025 dB maximum
• **Repeatability (sequential switching):** ±0.02 dB typical / ±0.025 dB maximum
• **Crosstalk:** −80 dB typical
• **Switching Time:** 25 ms first channel / 15 ms each additional channel
• **Maximum Input Power:** 300 mW optical
• **Connector Type:** FC/PC
• **Fiber Type:** Multimode 50/125 µm
## Key Features
• Dual independent 1×4 switching configurations for parallel or sequential test routing
• Stable performance with ±0.025 dB maximum insertion loss variation across switching cycles
• Exceptional crosstalk suppression at −80 dB typical for signal integrity in multichannel applications
• Fast channel switching: 25 ms to first channel, 15 ms incremental per additional channel
• FC/PC connectors supporting multimode fiber with high input power handling to 300 mW
## Typical Applications
• Multiwavelength optical signal routing and measurement
• Component characterization across the 850–1350 nm window
• Automated test sequencing in manufacturing environments
• Optical system validation and design verification
## Compatibility & Integration
The MAPS+1K18204L1FP operates within the JDS Uniphase MAP ecosystem, compatible with MAP Master (MAP+2M00) and MAP Benchtop (MAP+2B00) chassis platforms. As a hot-swappable module, it integrates into the modular instrumentation architecture, allowing rapid configuration changes for diverse optical testing workflows.
