The Keithley 2425 SourceMeter is a single instrument combining voltage source, current source, multimeter, and electronic load capabilities in a 100W, 100V, 3A platform. It delivers precision sourcing and measurement for DC parametric testing of components and devices in automated test and production environments. The half-rack form factor minimizes bench and rack space while eliminating the need for multiple separate instruments and complex interconnections.
Technical Specifications
Sourcing
• Voltage Source: 5 µV to 105 V range; 5 µV programming resolution (200 mV range); ±(0.025% of reading + 500 µV) accuracy (1 year, 23°C ±5°C); typically 50 mV noise (0.1 Hz–10 Hz, peak-peak into resistive load)
• Current Source: 500 pA to 3.15 A range; 500 pA programming resolution (0.1 µA range); ±(0.033% of reading + 2 nA) accuracy (1 year, 23°C ±5°C); 50 pA noise on 10 µA range (0.1 Hz–10 Hz, peak-peak)
• Maximum Output Power: 110 W (four-quadrant source or sink)
• Source/Sink Limits: ±3.15 A @ ±21 V; ±1.05 A @ ±105 V
• Compliance: Bipolar voltage and current limits, user-selectable, minimum 0.1% of range
• Output Overshoot: <0.1% typical (full-scale step, resistive load, 10 mA range)
• Transient Response: 30 µs minimum recovery after step load change
• Output Settling: 100 µs typical to 0.1% of final value (10 µA to 100 mA range, 1 V step, resistive load)
• Output Slew Rate: 0.25 V/µs (100 V range, 100 mA compliance); 0.08 V/µs (20 V range, 100 mA compliance)
Measurement
• Voltage: 1 µV to 105.5 V range; 6½-digit resolution; 0.012% basic accuracy
• Current: 100 pA to 3.165 A range; 6½-digit resolution; 0.012% basic accuracy
• Resistance: 10 µΩ to 21.1 MΩ range
• Reading Rate: 1700 readings/second at 4½ digits via GPIB
• Remote Sensing: 2-, 4-, and 6-wire configurations; 6-wire ohms with active guard and guard sense (except 1 A and 3 A ranges)
• Pass/Fail Comparator: Built-in for sorting and binning
– Key Features
• Four-quadrant operation sources and sinks power bidirectionally
• Programmable readback with compliance limits for fault protection
• Integrated multimeter eliminates separate instruments
• Fast transient response and low settling time enable dynamic testing
– Typical Applications
• Automated parametric testing of semiconductor devices and components
• Production-line electrical characterization and binning
• DC device and power supply validation
– Compatibility & Integration
GPIB interface for system integration and high-speed data acquisition.
