The Keithley 2430-C 1kW Pulse SourceMeter integrates a power supply, current source, multimeter, and electronic load into a single-channel DC parametric tester. This half-rack instrument delivers up to 1000 W pulsed output and 110 W DC, with four-quadrant source/sink operation across 0–100 V and 0–10 A ranges. Programmable bipolar voltage and current sourcing, combined with 0.012% measurement accuracy and 6½-digit resolution, enable precise characterization of high-power devices including laser diodes, LEDs, and power MOSFETs. Pulse mode minimizes device self-heating during test cycles, with adjustable pulse widths from 150 µs to 5 ms (2.5 ms on the 10 A range) and duty cycles up to 84%. A built-in sequencer stores 100 test routines for high-volume production. Three programmable sweep waveforms support I/V, I/R, V/I, and V/R characterization with single-event or continuous operation. Remote sensing (2-, 4-, and 6-wire) and floating output (±250 VDC from chassis ground) accommodate various test configurations.
Technical Specifications
• Voltage Source: 0–100 V maximum
• Current Source: 0–10 A DC and pulse mode
• Output Power: 1000 W pulsed; 110 W DC (source or sink)
• Pulse Width: 150 µs minimum to 5 ms maximum (2.5 ms on 10 A range); 50 µs typical resolution, 70 µs maximum
• Duty Cycle: 8% maximum on 10 A range; 84% maximum on all other ranges
• Measurement Accuracy: 0.012% basic
• Resolution: 6½ digits
• Reading Speed: Up to 1700 readings/second at 4½ digits via GPIB
• Voltage Regulation: 0.01% of range (line); 0.01% of range + 100 µV (load)
• Current Regulation: 0.01% of range (line)
• Voltage Compliance: Programmable, minimum 0.1% of range
• Floating Output: ±250 VDC from chassis ground
– Key Features
• Four-quadrant operation (source and sink)
• Programmable bipolar voltage and current
• Built-in sequencer for 100 test routines
• Three programmable sweep waveforms
• 2-, 4-, and 6-wire remote sensing
• Low-noise measurement capability
• High repeatability
– Typical Applications
• Breakdown voltage measurement of multilayer varistors and semiconductor components
• Characterization of laser diodes, LEDs, and power MOSFETs under high-current pulses
• Production I/V and V/I parametric testing
– Compatibility & Integration
GPIB interface; single-channel DC parametric test platform.
