The Keithley 2600-PCT-3B is a high-voltage parametric curve tracer engineered for I-V characterization of power semiconductor devices across research, development, and production environments. It delivers precise measurements from microvolts to 3 kV and femtoamperes to 100 A, supporting MOSFETs, BJTs, IGBTs, diodes, triacs, capacitors, and resistors. The instrument captures critical parameters including breakdown voltage, on-state voltage drop, leakage current, gate/base leakage, threshold voltage, forward transfer characteristics, and capacitance across 2-, 3-, and 4-terminal device configurations.
Technical Specifications
• Voltage Range: µV to 3 kV
• Current Range: fA to 100 A
• High Voltage Mode: 3 kV / 120 mA
• High Current Mode: 200 V / 10 A
• Capacitance Range: fF to µF with bias voltage up to 3 kV DC
• Measured Parameters: Breakdown voltage (BVDSS, BVCEO), on-state current (VDSON, VCESAT, VF), leakage current (IDSS, IR/ICBO, ICEO), gate/base leakage (IGSS, IB), threshold/cutoff voltage (VTH, VF, VBEON), forward transfer (YFS, GFS, HFE, gain), and capacitance (CISS, COSS, CRSS)
– Key Features
• Supports HV triax, SHV coax, and standard triax probe interfaces
• Software-configurable with real-time trace mode and parametric test mode
• Field upgradable to reliability or wafer sort tester configurations
• High-performance test fixture accommodating multiple package types
– Typical Applications
• Power semiconductor device characterization and qualification
• Advanced material testing including GaN, SiC, and LDMOS devices
• Reliability and stress analysis studies
• Incoming inspection and device qualification protocols
– Compatibility & Integration
Operation requires ACS Basic Edition software, which provides flexible measurement channel configuration and custom test creation capabilities.
