The Keithley 7001 Switch System with S40-CA02 module is a half-rack, high-density mainframe designed for automated signal routing across DC, RF, and optical applications. This modular platform delivers up to 80 channels per mainframe across two plug-in card slots, each supporting up to 40 channels. The system eliminates continuous computer intervention through built-in scan control, executing up to 165 channels/second with automatic break-before-make switching and non-volatile storage for 100 complete switch patterns. Configuration flexibility is enabled by an analog backplane supporting cascaded cards for multiplexer, matrix, or hybrid switching topologies.
Technical Specifications
• Mainframe Model: 7001
• Channel Capacity: Two slots × 40 channels maximum; up to 80 channels per mainframe
• Switching Range: DC from nanovolts to 1100 V; current from femtoamps to 5 A
• Signal Types Supported: DC, RF, optical
• Scan Speed: 165 channels/second maximum
• Pattern Memory: 100 complete switch patterns (battery-backed, non-volatile)
• Display: Dual-line vacuum fluorescent; simultaneous open/close status with graphical configuration aids
• Internal Timer: 1 ms to 99,999.999 seconds (1 ms increments)
• External Trigger: TTL-compatible, 600 ns minimum pulse width, rear panel BNC
• Status Output: Channel Ready signal (TTL-compatible, ~10 µs pulse, rear panel BNC)
• IEEE Interface: IEEE-488.2 and SCPI compliance; front-panel and bus programming
• Trigger Sources: External TTL, IEEE-488 bus (GET, *TRG), Trigger Link (front panel), internal timer
– Key Features
• Supports 40+ switch/control card variants for multi-signal routing
• Analog backplane enables card cascading for 1×80 multiplexer, 4×20 matrix, or hybrid configurations
• Automatic break-before-make prevents signal overlap during switching transitions
• Non-volatile battery-backed memory preserves 100 switch patterns across power cycles
• Programmable scan control with configurable channel and scan spacing
– Typical Applications
• Production testing with high channel density requirements
• Sensitive DC and low-level measurements
• RF and optical signal routing and validation
• Complex multi-signal test matrix configurations
– Compatibility & Integration
Full SCPI and IEEE-488.2 compliance enables integration into automated test equipment (ATE) environments. All operating parameters, scan sequences, and switching patterns are programmable via front-panel controls or IEEE bus commands.
