The Keithley 2400 Digital Source Meter is a single-channel instrument that integrates voltage source, current source, voltage meter, current meter, and ohmmeter functionality into one unit. It delivers four-quadrant operation—sourcing and sinking power—with 0.012% basic measurement accuracy and 6½-digit resolution across coupled voltage and current sourcing and measurement. Maximum output is 20 W, with measurement speeds to 1700 readings per second at 4½ digits via GPIB. Built-in pass/fail comparator, linear/logarithmic/custom sweep capabilities, and support for 2-, 4-, and 6-wire sensing make it suited for DC parametric characterization in semiconductor, communications, computer, automotive, and medical applications.
Technical Specifications
Electrical Output:
• Voltage source: ±200 mV to ±200 V
• Voltage programming resolution: 5 µV to 5 mV
• Current source: ±1 µA to ±1 A
• Maximum power: 20 W
Measurement Capabilities:
• Voltage measurement resolution: 100 nV
• Current measurement resolution: 1 pA
• Resistance range: 0.2 Ω to 200 MΩ and greater
• Basic accuracy: 0.012% at 6½-digit resolution
• Temperature coefficient: ±(0.15 × accuracy specification)/°C (0–18°C and 28–50°C)
Performance:
• Measurement speed: 1700 readings/second at 4½ digits (GPIB)
• Current regulation: 0.01% of range (line and load); overshoot <0.1% typical
• Low-noise source and multimeter for high repeatability
– Key Features
• Four-quadrant operation for bidirectional power handling
• 6½-digit DMM integration with 0.012% accuracy
• Programmable DIO port for automation and handler control
• 2-, 4-, and 6-wire remote sensing (6-wire includes guarded ohms)
• Built-in comparator for component sorting and binning
• Linear, logarithmic, and custom voltage/current sweeps
– Typical Applications
DC parametric testing, device characterization, production test and binning, LED and laser diode I-V curves, transistor and semiconductor parameter extraction.
– Compatibility & Integration
GPIB interface for remote control and data acquisition. Programmable digital I/O enables direct integration with automated test handlers and probe systems.
