The Keithley Series 2600 System SourceMeter is a multi-channel I-V test solution that integrates sourcing and measurement into a single instrument for high-throughput production testing. Built on third-generation Source Measure Unit (SMU) technology, it combines a precision power supply, true current source, 6-1/2 digit DMM, arbitrary waveform generator, pulse generator, and electronic load. Available in single- and dual-channel configurations, the Series 2600 performs 4-quadrant voltage and current sourcing and sinking across benchtop characterization and fully automated production environments. TSP (Test Script Processing) technology embeds test programs within the instrument to enhance system-level throughput, while TSP-Link expansion enables multi-channel parallel testing without mainframe integration.
Technical Specifications
Voltage & Current Ranges:
• Voltage source: 100 nV to 200 V (model-dependent: 40 V, 200 V, or ±200 V)
• Current source: 0.1 fA to 10 A pulse (model-dependent: 3 A DC, 1.5 A DC, or ±1.5 A DC)
• Resolution: 6-1/2 digits; measurement as fine as 0.1 fA / 100 nV
Power Output:
• Standard models: Up to 40 W per channel
• Select models: Up to 30 W per channel
• Pulse capability: Up to 200 W
Speed & Throughput:
• Measurement range change rate: >4500/second
• Source range change rate: >400/second
• Source function change rate: >500/second
• Reading buffer speed: Up to 20,000 readings/second
• Pulse width: <100 µs settled; minimum 100 µs programmable with 1 µs resolution
• Pulse width jitter: 2 µs typical
• TSP-Link synchronization: <500 ns across all channels
Accuracy:
• Voltage source: ±(0.02% of reading + 1 mV) in specified ranges
• Current source: ±(0.06% of reading + 100 pA) in specified ranges
– Key Features
• Integrated SMU technology performs sourcing and measurement simultaneously
• 4-quadrant operation supports bidirectional voltage and current
• TSP embedded test programming eliminates external controller dependence
• TSP-Link synchronization enables parallel multi-channel testing
• Pulse generation with <100 µs pulse width and 2 µs jitter
• Up to 20,000 readings/second buffering for rapid data acquisition
– Typical Applications
• Device characterization and curve tracing
• Semiconductor component testing
• LED and power device evaluation
• Battery and power source testing
• Pulse and transient measurements
– Compatibility & Integration
Single- and dual-channel models support standalone operation or multi-unit expansion via TSP-Link technology for synchronized parallel testing.
