The Kepco BOP15-20M is a 300 W bipolar operational power supply and high-speed amplifier designed for precision test and measurement applications requiring bidirectional power delivery. Operating across all four quadrants of the voltage-current plane, it sources and sinks current at full rated capacity, delivering dynamic control for semiconductor testing, automotive component validation, and medical imaging systems. Unlike general-purpose supplies, the BOP15-20M prioritizes speed and control accuracy over basic power distribution.
## Technical Specifications
**Electrical Performance**
• Output voltage: ±0 to ±15 V DC
• Output current: ±0 to ±20 A DC
• Power output: 300 W
• Bidirectional capability: 100% source and sink across full rating
• Voltage regulation (load): <1.0 mV
• Voltage regulation (8-hour drift): <0.1 mV
• Voltage regulation (temperature): <0.08 mV/°C
• Current regulation (load): <10 nA
• Current regulation (8-hour drift): <50 nA
• Current regulation (temperature): <50 nA/°C
• Voltage ripple and noise: <0.01% of output voltage
• Current ripple and noise: <0.05% of output voltage or 3 mV (whichever greater)
• Common mode current: <5 µA rms, 50 µA peak-to-peak at 115 V AC, 60 Hz
• Voltage slew rate: 2 V/µsec
• Current slew rate: 0.4 A/µsec
**Output Impedance**
• Voltage mode: 20 µΩ series resistance, 50 µH series inductance
• Current mode: 20 kΩ shunt resistance, 0.2 µF shunt capacitance
**Power Requirements**
• Input: Factory-configured 105–125 V AC, 50–65 Hz; reconfigurable to 210–250 V AC, 50–65 Hz via jumper
## Key Features
• Independent voltage and current control circuits with automatic limit crossover
• Analog control via voltage or resistance input
• Digital control via GPIB, SCPI, or RS232
• 50-terminal user connector for control and status signals
• Load optimization: Best high-speed performance with resistive loads
• Capacitive load compensation available via feedback capacitance adjustment or "C" option models
• Inductive load support via "L" option models or external RC networks
## Typical Applications
• Semiconductor device characterization
• Automotive component testing under dynamic conditions
• Medical imaging system validation
• Transient response simulation
• Arbitrary waveform generation and replication
