The Keysight (Agilent) 81141A is a high-performance pulse data generator designed for testing high-speed digital systems and components up to 7 GHz. It delivers precise control over pulse and data stream parameters with low-jitter signals essential for physical layer measurements, jitter tolerance analysis, and stress testing applications across R&D, manufacturing, and quality assurance environments.
Technical Specifications
Signal Generation
• Frequency range: 150 MHz to 7 GHz
• Output formats: Pulse, Data Pattern, and PRBS (Pseudo-Random Binary Sequence)
• Data formats: RZ, R1, and NRZ
• PRBS capability: 2^5-1 to 2^31-1
• Pattern memory: 32 Mbit for complex, real-world data simulation
• Sequencing: One level with up to 4 blocks for protocol-like generation
• Transition time: <20 ps (10%/90%)
Jitter Characteristics
• Clock mode jitter: <1 ps RMS
• Data mode jitter: 9 ps peak-to-peak
• Jitter modulation bandwidth: Up to 1 GHz
• Delay modulation range: -100 ps to +100 ps
Output Specifications
• Single channel: Data and clock, differential or single-ended
• Amplitude range: 0.1 Vpp to 1.8 Vpp (5 mV resolution)
• Output voltage window: -2 V to +3 V
• Output impedance: 50 Ω nominal
• Connector: 2.4 mm female
Timing Control
• Clock/Data delay range: ±0.75 ns (100 fs resolution)
• External delay control: Modulates jitter via external signal (400 ps/V sensitivity, ±5% linearity)
• Delay control input: DC coupled, 50 Ω, SMA female
– Key Features
• Flexible sequencing with pattern trigger mode synchronized to user-specified PRBS patterns
• Divided clock triggering at factors of 2, 4, 8, 10, 16, 20, 32, 64, and 128
• External clock input and trigger I/O (Aux In, Trigger Out)
• External termination voltage adjustment: -2.0 V to +3.0 V
– Typical Applications
• High-speed digital component characterization and stress testing
• Jitter tolerance and jitter transfer measurements
• Protocol-based data stream generation for device validation
• Physical layer testing up to 7 GHz
– Compatibility & Integration
Accepts external clock signals and integrates trigger inputs for synchronized operation with automated test systems and measurement instruments.
