The Keysight/Agilent/HP 3562A Dynamic Signal Analyzer is a dual-channel FFT-based instrument for time and frequency domain signal analysis. It delivers network analysis, spectrum analysis, waveform analysis, and transient event capture across a measurement range of 64 µHz to 100 kHz. The instrument combines high-resolution frequency analysis with flexible signal sourcing and waveform recording capabilities, serving electronics, mechanical, and electromechanical control system testing.
Technical Specifications
Frequency Domain Analysis
• Measurement range: 64 µHz to 100 kHz
• Linear resolution: Span/800
• Zoom analysis resolution: Down to 25.6 µHz
• Analysis modes: Network, spectrum, waveform, and transient
• Measurement techniques: Linear resolution FFT, logarithmic resolution, swept sine analysis
Electrical Characteristics
• Measurement range: 150 dB
• Dynamic range: 80 dB
• Single-channel amplitude accuracy: ±0.15 dB
• Frequency response magnitude accuracy: ±0.1 dB
• Frequency response phase accuracy: ±0.5°
• Input signal level: Up to ±10 Vpeak (AC + DC) into 10 kΩ load
• DC offset: ±10 Vpeak in 100 mV steps
• Noise floor (500 Ω source, -51 dBV range): <-126 dBV at 20 Hz–1 kHz; <-115 dBV at 1 kHz–100 kHz
Signal Source
• Output signals: Noise and sine signals
• Signal types: Random noise, burst random, sine chirp, burst chirp, fixed sine, swept sine
• Output level: ±10 Vpeak (AC + DC)
• Analog signal output available from digital source connector
Time Domain Analysis
• Waveform sampling, digitization, and storage to internal memory or external disk via HP-IB
• Trigger modes: Free run, input channels 1 or 2, source, external
• Trigger delay resolution: 1 sample (1/2048 of time record)
• Pre-trigger: 1 to 4096 samples
• Post-trigger: 1 to 65,536 samples
– Key Features
• Dual-channel architecture enables simultaneous two-channel measurements
• Built-in signal source eliminates external equipment for network analysis
• Stored waveforms can be recalled and analyzed in time and frequency domains
• Zoom and baseband analysis capabilities for detailed signal inspection
– Typical Applications
• Electronics testing and characterization
• Mechanical vibration and structural analysis
• Electromechanical control system validation
• Transient event capture and analysis
– Compatibility & Integration
HP-IB interface enables external disk storage and instrument control without a dedicated computer.
