The Keysight M9195A is a PXIe Digital Stimulus/Response Module engineered for high-performance digital testing in IC validation and production test environments. This 16-channel bidirectional module combines stimulus generation, response capture, and per-channel parametric measurement in a single card, delivering 250 Mbps data rates and sub-nanosecond edge placement control. With programmable logic levels spanning -1.5 V to +6.5 V and integrated 4-quadrant parametric measurement capability, the M9195A addresses demanding timing margin analysis, real-time pattern comparison, and on-the-fly pattern editing workflows.
Technical Specifications
Channel Architecture
• 16 bidirectional digital channels, configurable as one 16-channel site or up to four independent 4-channel sites
• Maximum data rate: 250 Mbps
• Maximum return-to-zero clock rate: 250 MHz
• Per-bit timing control: 1 ns edge placement resolution
Voltage and Drive Characteristics
• Programmable logic levels: -1.5 V to +6.5 V per channel
• Logic level resolution: 152 µV per channel
• Drive voltage accuracy: ±25 mV (VIH & VIL), DUT centric, with AutoCorrections over ±5°C
• Receive voltage accuracy: ±20 mV (VOH & VOL), DUT centric, with AutoCorrections over ±5°C
• Drive rise/fall time: <9 ps @ 1 Vpp, <10 ps @ 3 Vpp, <11 ps @ 6 Vpp (typical, into 50 Ω, 20%-80%)
• Channel impedance: <10 Ω (terminating mode), 50 Ω (forcing mode, nominal)
• Drive channel short circuit limit: ±60 mA per channel; 250 mA maximum per module combined
Parametric Measurement Unit (PPMU)
• Per-channel 4-quadrant operation with FVMI, FIMV, FVMV, FIMI, and FNMV modes
• Active load range: 0–25 mA (16-bit resolution, 762 nA)
• Current measurement ranges: ±2 µA to ±40 mA for leakage characterization
• Combined module limit: 250 mA across all channels
Interface and Control
• Bus interface: PXI Express (x1, x4, x8 PCIe v2.1)
• Per-channel programmable delay for stimulus/response compensation
• Flexible pattern sequencing with deep vector memory
– Key Features
• Sub-10 ps edge timing enables precision margin testing across logic families
• Real-time comparison and on-the-fly pattern generation minimize test cycle time
• Programmable cable delay compensation accommodates high-speed interconnect paths
• 16-bit parametric resolution supports accurate leakage and load-current profiling
– Typical Applications
• Digital IC functional and parametric validation
• Production test of logic, memory, and mixed-signal devices
• Timing margin analysis and characterization
• Multi-site test configurations via independent 4-channel site mapping
– Compatibility & Integration
The M9195A operates as a PXI Express peripheral module within Keysight test platforms, integrating directly into modular test architectures supporting complex stimulus/response workflows and parametric measurements at system speed.
