The Keysight M9195A is a single-slot PXIe Digital Stimulus/Response module engineered for high-speed digital testing in IC validation and production environments. It delivers 16 bidirectional data channels with per-channel Parametric Measurement Units (PPMU), pattern generation, synchronized data capture, and flexible timing control. The module supports logic levels from −1.5 V to +6.5 V with 152 µV resolution, achieves 250 Mbps maximum data rate and 250 MHz RTZ clock frequency, and includes 4 high-voltage channels for flash programming and fuse test operations, plus 4 open-drain auxiliary outputs and 2 GPIO channels.
Technical Specifications
Module Architecture
• PXIe peripheral module, single-slot 3U form factor
• PCI Express v2.1 interface (x1, x4, x8)
• 16 bidirectional data channels with independent per-channel configuration
Digital I/O Performance
• Programmable logic levels: −1.5 V to +6.5 V
• Logic level resolution: 152 µV
• Maximum data rate: 250 Mbps
• Maximum RTZ clock frequency: 250 MHz
• RTZ and NRZ modes supported for cyclized data
Per-Channel Parametric Measurement
• 4-quadrant PPMU capability (FVMI, FIMV, FVMV, FIMI, FNMV modes)
• Current ranges: ±2 µA to ±40 mA
• Enables accurate leakage and parametric characterization
Timing and Pattern Control
• Edge placement resolution: 1 ns
• Multiple drive edges per cycle with flexible edge placement
• Per-pin adjustable output delay and receive delay for cable compensation
• High-performance pattern cyclizer for advanced pattern creation
• Deep vector memory: 2 GB total (shared allocation between pattern, response capture, and sequence control)
• On-the-fly pattern generation and editing without recompilation
Specialized Channels
• 4 high-voltage channels (flash programming, fuse test)
• 4 open-drain auxiliary output channels (fixture relays)
• 2 GPIO channels
Multi-Site Operation
• Supports one 16-channel site or four independent 4-channel sites
• Up to four multi-sites with independent sequencers
• Site-independent clock operation enabled
– Key Features
• Flexible parametric measurement across all 16 channels simultaneously
• Per-vector direction and timing control for precise margin testing
• Stimulus/Response delays for timing characterization and propagation compensation
• Deep pattern memory with efficient cross-site allocation
– Typical Applications
• IC design validation and characterization
• Production test of digital and mixed-signal devices
• High-voltage functional and parametric testing
• Leakage measurement and power analysis
– Compatibility & Integration
The M9195A integrates into PXIe chassis supporting PCIe v2.1 peripheral modules and operates as a standard PXI Express instrument within Keysight test automation frameworks.
