The Keysight (Agilent) P5006A is a 2-port Vector Network Analyzer delivering RF and microwave characterization from 100 kHz to 32 GHz. This USB 3.0-controlled instrument combines exceptional dynamic range with compact form factor, making it ideal for component and system testing in laboratory and production environments. The P5006A leverages Keysight’s intuitive PNA-series graphical interface and supports all Keysight electronic calibration (ECal) modules for rapid, repeatable measurements across filter design, amplifier testing, and antenna characterization applications.
Technical Specifications
• Frequency Range: 100 kHz to 32 GHz
• Ports: 2-port configuration
• Impedance: 50 Ω (nominal)
• Output Power: 10 dBm
• Dynamic Range: 140 dB
• Trace Noise: 0.0015 dB rms
• IF Bandwidth: 10 Hz (specification testing)
• Test Port Connectors: 2.4 mm female
• Computer Interface: USB 3.0
• Reference Input: MCX connector, −3 to +10 dBm, 10 MHz ± 10 ppm
• Reference Output: MCX connector, 0 to +10 dBm (nominal)
– Key Features
• 140 dB dynamic range supports deep-null reflection and transmission measurements
• Mechanical calibration (85058B kit) achieves directivity to ±0.019 dB (100 kHz–1 MHz) and source match of 34 dB
• Electronic calibration with N4694D ECal module delivers directivity and reflection tracking to ±0.04 dB (50 MHz–2 GHz)
• Minimal trace noise at 0.0015 dB rms ensures measurement confidence
• External reference input/output enables synchronization with external signal sources
• Warrantied performance at 25 °C ± 5 °C after 60-minute thermal stabilization
– Typical Applications
• Filter design and optimization
• Amplifier gain and stability characterization
• Antenna impedance and radiation pattern support
• Component S-parameter verification
• System-level RF/microwave testing
– Compatibility & Integration
The P5006A operates as a USB 3.0 peripheral requiring an external host PC. Full compatibility with Keysight’s ECal module ecosystem enables rapid, traceable calibration workflows without mechanical manipulation.
