The Keysight L4450A is a 64-bit digital I/O module that delivers high-performance pattern simulation, capture, and event measurement for automated test systems and industrial control applications. Built around 64 bi-directional I/O lines organized as eight 8-bit channels, the module supports programmable polarity, variable input thresholds up to 5 V, and configurable output modes (active drive or open drain). On-board 128 KB pattern memory enables digital signal simulation and capture at rates up to 10 MHz, while dual counter/totalizer channels measure frequency, period, duty cycle, pulse width, and event counts to 10 MHz. A programmable 20 MHz divide-by-N clock output and gate functions extend measurement flexibility.
Technical Specifications
• Digital I/O: 64 bi-directional lines (eight 8-bit channels), 24 mA source/sink per line
• Programmable Thresholds: Up to 5 V
• Output Configuration: Active drive or open drain (with user-supplied 10 kΩ pull-up resistor)
• Pattern Memory: 128 KB for simulation and capture at 10 MHz (50% duty cycle)
• Counter/Totalizer Channels: Two channels, 10 MHz maximum frequency
• Measurement Functions: Event count, frequency, period, duty cycle, pulse width, gate functions
• Clock Output: Programmable with divide-by-N capability (20 MHz)
• Connectors: Standard 78-pin D-sub for cables, terminal blocks, and mass interconnect
• Power: Universal 100 V to 240 V ±10% AC
– Key Features
• LXI Class C compliant Ethernet connectivity (10BaseT/100BaseTx)
• Optional IEEE 488.2 GPIB interface for legacy system integration
• Web-based graphical interface for remote setup, troubleshooting, and real-time monitoring
• IVI-C and IVI-COM driver support across Windows platforms
• Native software drivers for LabVIEW, VEE Pro, TestStand, Measurement Studio, LabWindows/CVI, and Visual Studio .NET
• Keysight I/O Libraries Suite 14 or greater included
– Typical Applications
• Automated test equipment (ATE) for digital subsystems
• Industrial control and process monitoring
• High-speed digital pattern generation and capture
• Event counting and frequency measurement in multi-channel systems
– Compatibility & Integration
The module integrates with standard test frameworks through IVI drivers and native support for National Instruments TestStand, Switch Executive, and Measurement Studio. C/C++ and Visual Basic 6 programming interfaces enable custom application development.
