The National Instruments PXIe-6570 is a 32-channel digital pattern instrument for semiconductor characterization and production testing. It delivers 100 MHz vector rate with 39.0625 ps edge placement resolution, 128 M vectors per channel, and support for up to 256 synchronized system channels. The instrument features bidirectional PPMU-capable I/O, multi-site testing for up to 8 parallel sites, and integrated Digital Pattern Editor for pattern development, pin mapping, timing configuration, and debugging via Shmoo plots and digital scopes.
Technical Specifications
• Channel Configuration: 32 channels per module; up to 256 channels in synchronized subsystem; up to 512 channels with multiple modules
• Vector Rate: 100 MHz with 39.0625 ps edge placement resolution
• Vector Memory: 128 M vectors per channel
• Pattern Formats: Non-return, return to low, return to high, surround by complement
• Time Sets: 31 timing configurations
• Multi-Site Support: Up to 8 sites with dedicated source, capture, and history memory resources
• History RAM: 1,023 cycles (NI-Digital 17.5 and earlier); 8,192 cycles (NI-Digital 18.0 and later)
• Source Memory: 32 MB (256 Mbit)
• Voltage Range (Digital): -2 V to 6 V
• PPMU Force Voltage: -2 V to 7 V
• PPMU Measurement Range: -2 V to 7 V
• Maximum DGS Offset: ±300 mV
• Data Rate: Up to 200 Mb/s
• Clock Generation: Up to 160 MHz
– Key Features
• Pin Parametric Measurement Unit (PPMU) for bidirectional force and measure on grouped pins
• Parallel PPMU measurements across different banks
• 68-pin VHDCI Digital Data and Control (DDC) connector
• Multi-language software support: LabVIEW API, .NET API, Python API documentation
– Physical & Integration
• Dimensions: 131 mm × 42 mm × 214 mm (5.16 in. × 1.65 in. × 8.43 in.)
• Weight: 920 g (32.45 oz.)
• Form Factor: Two-slot PXI Express module requiring two adjacent compatible slots
• Power: 3.3 V and 12 V rails; power consumption within input specification
