The NI PXI-5114 is a 250 MS/s, 8-bit digitizer module for PXI chassis, delivering dual-channel real-time signal acquisition with 125 MHz analog bandwidth. Built for automated time-domain measurements in communications, aerospace, military, scientific research, and consumer electronics testing, it combines flexible input configurations, deep onboard memory options, and advanced triggering capabilities into a compact 3U form factor.
Technical Specifications
• Sampling Rate: 250 MS/s real-time; 5.0 GS/s Random Interleaved Sampling (RIS)
• Vertical Resolution: 8-bit
• Analog Bandwidth: 125 MHz
• Channels: 2
• Onboard Memory: 8 MB standard per channel; optional 64 MB or 256 MB per channel
• Maximum Records: 32,768 (8 MB), 100,000 (64 MB)
• Input Impedance: Software-selectable 1 MΩ or 50 Ω
• Input Coupling: AC, DC, GND
• Input Voltage Range: 40 mV to 40 V (selectable)
• Trigger Types: Edge, window, hysteresis, digital, and video (SDTV/EDTV/HDTV)
• Trigger Timestamping: 40 ps resolution
• Internal Clock: 250 MHz
• External Clock Input: 50 MHz to 250 MHz
• Reference Clock Options: PXI 10 MHz phase lock; external 1 MHz to 20 MHz; PLL 5 MHz to 20 MHz
• Synchronization: NI-TClk, PXI, and subnanosecond inter-channel via SMC architecture
• Noise Filter: 20 MHz bandwidth-limiting filter
• Power Consumption: 21.63 W
• Operating Temperature: 0 °C to 55 °C
• Storage Temperature: -40 °C to 71 °C
– Key Features
• Flexible record length from 1 sample minimum with full pretrigger and posttrigger capability
• Selectable input voltage ranges for signal conditioning across diverse amplitude requirements
• Multiple trigger modes including video signal triggering for broadcast/display applications
• PFI digital I/O on lines 0 and 1 for external trigger and probe compensation control
• BNC analog input connectors with SMB and 9-pin mini-circular DIN auxiliary connectors
– Typical Applications
Transient signal capture, waveform characterization, protocol analysis, video signal monitoring, and synchronized multi-channel acquisition in automated test environments.
– Compatibility & Integration
NI-SCOPE instrument driver support enables integration with LabVIEW, TestStand, and NI system design platforms. Operates within standard PXI 3U modular chassis for scalable test system architecture.
