The Keysight M9195B is a 1-slot PXIe Digital Stimulus/Response module designed for IC validation and production test. It delivers 16 bidirectional channels with programmable logic levels spanning -1.5 V to +6.5 V and 152 µV resolution per channel. The module operates at pattern application rates up to 250 MHz in RZ and NRZ modes, with 1 ns edge placement resolution and per-channel programmable delay compensation.
Each channel integrates a Per-Pin Parametric Measurement Unit (PPMU) supporting five measurement modes: FVMI, FIMV, FVMV, FIMI, and FNMV. Current measurement spans five ranges from ±2 µA to ±40 mA, with 100 fA resolution and ±(1% + 1 nA) accuracy. Voltage measurement delivers 100 nV resolution and ±(1% + 1 mV) accuracy. Programming accuracy reaches ±(0.1% + 0.1 nA) for current and ±(0.1% + 0.1 mV) for voltage.
The module features a high-performance pattern cyclizer for advanced pattern creation including multiple drive edges per cycle. Deep vector memory is flexibly allocated per channel or site, with pattern sequencing supporting up to four independent multi-sites, each with independent sequencers for parallel test execution.
Multi-module synchronization enables combining up to 12 M9195B modules for systems reaching 192 channels, with typical channel-to-channel skew of ±300 ps across all modules.
Technical Specifications
• Channels: 16 bidirectional with programmable logic levels -1.5 V to +6.5 V
• Resolution: 152 µV per channel; PPMU current 100 fA, voltage 100 nV
• Pattern Rate: Up to 250 MHz (RZ and NRZ modes)
• Edge Placement: 1 ns resolution
• PPMU Current Ranges: ±2 µA to ±40 mA (5 ranges)
• PPMU Modes: FVMI, FIMV, FVMV, FIMI, FNMV
• Multi-Site Support: Up to 4 independent sites with independent sequencers
• Module Synchronization: Up to 12 modules (192 channels max); ±300 ps typical skew
– Key Features
• Per-channel stimulus/response delay compensation for fixture propagation
• Pattern cyclizer with multiple drive edges per cycle capability
• Flexible deep vector memory allocation
• Programmable measurement accuracy to ±(0.1% + 0.1 nA) current and ±(0.1% + 0.1 mV) voltage
– Typical Applications
• IC design validation and debug
• Production digital and parametric testing
• Leakage and quiescent current characterization
• High-speed digital stimulus/response measurement
– Compatibility & Integration
PXIe form factor operates within PXIe chassis ecosystems. Supports multi-module expansion for scaled test capacity with synchronized timing across distributed channels.
