The NI PXI-5406 is a 16-bit arbitrary function generator delivering 40 MHz maximum bandwidth for precise signal synthesis in modular PXI systems. This single-channel instrument combines Direct Digital Synthesis (DDS) with up to 4X digital interpolation to achieve effective sample rates of 400 MS/s, supporting both standard waveforms and user-defined arbitrary signals. Built for research, development, and production testing across aerospace, defense, semiconductor, and consumer electronics, it provides exceptional signal fidelity with sub-4 ps jitter and noise floors reaching -148 dBm/Hz.
Technical Specifications
Waveform Generation
• DAC Resolution: 16 bits
• Sample Clock: 100 MS/s maximum
• Maximum Bandwidth: 40 MHz
• Effective Rate with Interpolation: Up to 400 MS/s (4X digital)
• Onboard Memory: 32 kB
• Supported Waveforms: Sine, square, triangle, ramp, noise, DC offset
• Generation Methods: DDS for repetitive waveforms; arbitrary waveforms via data sequences or continuous streaming
Output Characteristics
• Channels: 1
• Voltage Range: ±5 V (ACpk + DC)
• 50 Ω Load Output: 5.64 mVpk-pk to 10 Vpk-pk
• High-Impedance Load Output: 11.28 mVpk-pk to 20 Vpk-pk
• Amplitude Resolution: <0.06% (0.004 dB)
• Output Impedance: User-compensated resistive loads
Signal Accuracy & Performance
• AC Amplitude Accuracy: ±2.0% of amplitude ±1 mV
• Offset Accuracy: ±0.5% of offset ±2 mV, ±0.5% of amplitude
• Passband Flatness (Sine): ±0.4 dB across bandwidth
• Phase Noise Density (10 MHz Sine): -100 dBc/Hz @ 100 Hz, -110 dBc/Hz @ 1 kHz, -120 dBc/Hz @ 10 kHz
• Frequency Resolution: 0.355 µHz
• Frequency Accuracy (no PLL reference): ±25 ppm
• Jitter (Sine @ 10 MHz): <4.0 ps rms (100 Hz to 100 kHz)
• Noise Floor: -148 dBm/Hz (low amplitudes)
Filtering & Processing
• Analog Filter: 7-pole elliptical for image suppression
• Digital Filter: Available above 10 MS/s sample rates
• Phase-Continuous Frequency Sweeping: Supported
– Typical Applications
Design verification and characterization; sensor and transducer testing; receiver validation; RF component production test; arbitrary waveform experimentation.
– Compatibility & Integration
PXI modular instrument platform; NI-FGEN driver support for user-specified load compensation.
