The NI PXIe-5652 is a 6.6 GHz RF analog signal generator designed for automated test and measurement within a compact PXI Express form factor. It delivers continuous-wave and modulated signals with precise frequency control, low phase noise, and fast settling times suitable for demanding RF and microwave test scenarios. The instrument supports standard modulation formats—AM, FM, PM, and pulse—alongside basic waveform modulation (sine, triangle, square) from 1 Hz to 100 kHz. Its Direct Digital Synthesis architecture enables high-resolution frequency hopping and phase-continuous sweeping, making it ideal for integration into larger PXI-based automated test systems targeting radar, RFIC, and automotive applications.
Technical Specifications
Frequency Performance
• Frequency range: 500 kHz to 6.6 GHz (tunable to 100 kHz with uncalibrated amplitude)
• Frequency resolution: <3 Hz (500 kHz to <1.3 GHz), <6 Hz (1.3 GHz to <3.3 GHz), <12 Hz (3.3 GHz to 6.6 GHz)
• Frequency settling time: as low as 0.2 ms typical; typical tuning time 1.5 ms
• Narrow loop bandwidth settling: median 6.5 ms (≤0.01 ppm), maximum 13 ms
Signal Purity
• Phase noise: –110 dBc/Hz typical at 1 GHz, 10 kHz offset
• Spectral purity: –105 dBc/Hz to –93 dBc/Hz depending on frequency
Output Characteristics
• Maximum output power: 12 dBm
• Amplitude range: –90 dBm to 10 dBm (50 MHz to <500 MHz)
• Amplitude resolution: <0.1 dB
• Output impedance: 50 Ω
• VSWR: <1.8:1 typical (500 kHz to 3.3 GHz), <2.0:1 typical (3.3 GHz to 6.6 GHz)
• Output coupling: AC
Reference Clock
• Internal reference output: 10 MHz, 1 Vpk-pk into 50 Ω
• External reference input: 10 MHz ±10 ppm, 0.2 Vpk-pk to 1.5 Vpk-pk, 50 Ω impedance
Power Requirements
• +3.3 VDC: 0.90 A typical, 1.00 A maximum
• +12 VDC: 0.80 A typical, 1.00 A maximum
– Key Features
• Direct Digital Synthesis for high-resolution frequency agility
• Low phase noise performance across the full frequency range
• Modulation support: CW, FM, 2-FSK, OOK with standard AM, FM, PM, and pulse generation
• Fast frequency settling enables rapid test sequencing
• PXI Express modularity for system-level integration
– Typical Applications
• Radar system testing and validation
• RF integrated circuit characterization
• Automotive RF component testing
• Modulated signal generation for receiver testing
– Compatibility & Integration
The PXIe-5652 integrates into PXI-based automated test platforms, accepting external 10 MHz reference signals for system synchronization.
