The NI VXI-MIO-64XE-10 is a single-slot, C-size VXI multifunction I/O module delivering 64 analog input channels, 2 analog output channels, and 8 TTL-compatible digital I/O lines. This module provides integrated data acquisition and control for demanding measurement systems, supporting simultaneous analog and digital signal processing with 16-bit resolution across all input and output functions.
Technical Specifications
Analog Input
• 64 channels with 16-bit resolution
• Input modes: NRSE, RSE, DIFF
• Programmable gain: 1, 2, 5, 10, 20, 50, 100
• Unipolar range: 0 to +10 V
• Bipolar range: ±10 V
• Maximum sampling rate: 100 kS/s
• Analog input bandwidth: 255 kHz
Analog Output
• 2 channels, 16-bit resolution
Digital I/O
• 8 TTL-compatible lines
Timing and Counters
• 10 timers/counters with 50 ns resolution
• DAQ-STC system timing controller with dedicated groups for AI, AO, and Counter/Timer functions
– Key Features
• 100 kS/s sampling supports high-speed transient capture and real-time signal monitoring
• Multi-input mode configuration accommodates single-ended, differential, and non-referenced single-ended signals
• Programmable gain per channel eliminates external conditioning for low-level measurements
• 50 ns timer resolution enables precision timing control and event synchronization
• VXIplug&play compliance ensures interoperability within VXI architectures
• SCXI system compatibility for expanded measurement range
– Typical Applications
• Multi-channel temperature and pressure data logging
• Real-time control systems interfacing RTDs, thermocouples, and voltage/current sources
• Mixed-signal test requiring coordinated analog and digital I/O
• Synchronized distributed measurements across multiple instrument slots
– Compatibility & Integration
The module operates under NI-DAQ driver software and supports VXIplug&play-compliant development environments including LabVIEW, LabWindows/CVI, NI-VISA, and NI-VXI. Multi-function synchronization allows precise timing alignment between analog and digital channels for coherent data acquisition across independent measurement subsystems.
