The Racal Instruments 1260-45A-st is a high-density VXIbus switching matrix module engineered for automated test equipment requiring flexible signal routing and complex matrix configurations. This single-slot C-size module configures into eleven different matrix topologies—from four 4×16 two-wire matrices to one 16×16 two-wire matrix—accommodating diverse switching architectures within a single instrument. Non-latching guard relays at row inputs protect the Unit Under Test by reverting to open state on power loss; jumper-selectable latching relay bypass preserves signal paths during power cycles. Message-based control via Option 01 (native command set) or Option 01T (SCPI command set) smart card modules enables seamless integration into VXIbus systems.
Technical Specifications
Electrical Performance
• Maximum switchable voltage: 300 VDC or ACrms (terminal-terminal or terminal-chassis)
• Maximum switchable current: 1 ADC or ACrms per channel
• Maximum switchable power: 30 WDC, 62.5 VA per channel
• Path resistance (maximum): ≤ 500 mΩ
• Isolation: > 2 GΩ
AC Characteristics (into 50 Ω)
• Open channel capacitance (Hi to Lo): < 50 pF
• Closed channel capacitance (Hi to Lo): < 80 pF
• Bandwidth (-3 dB): 25 MHz (4×16 and 4×32 configurations), 20 MHz (4×64), 10 MHz (16×16)
• Crosstalk: < -50 dB at 1 MHz
– Key Features
• Eleven configurable matrix topologies in a single module
• Dual-mode relay architecture: non-latching with guard function or full-latching via jumper bypass
• Proven path resistance and isolation for low-signal applications
• Configuration-dependent bandwidth up to 25 MHz
• CE marked for RF emissions, EMI immunity, and electrical safety compliance
– Typical Applications
• Automated test equipment requiring reconfigurable signal routing
• Mixed-signal test systems demanding high channel density
• Production test environments with variable matrix topology requirements
– Compatibility & Integration
Control via Option 01 or Option 01T smart card modules. VXIbus-native integration for modular ATE architectures.
