The Tektronix TDS8200 is a high-performance digital sampling oscilloscope engineered for acquisition and measurement of ultrafast signals in research, design validation, and manufacturing test environments. Built on the modular 8200 Series platform, it delivers superior signal fidelity and fast acquisition rates essential for semiconductor testing, component characterization, Time Domain Reflectometry, and applications demanding tens-of-GHz bandwidths. The instrument operates via a Windows 2000 graphical interface with integrated online help.
Technical Specifications
• Bandwidth: DC to 70+ GHz (electrical modules); up to 28 GHz optical bandwidth with optical modules
• Sample rate: 40.00 GSa/sec
• Channels: Up to eight signal channels via four dual-channel electrical or two optical sampling modules
• Jitter: <200 fs RMS in Phase Reference mode; free-run and triggered modes available at identical jitter specification
• TDR reflected risetime: ≤35 ps with true differential TDR/TDT capability and support for up to four differential pairs
• Crosstalk measurements supported on differential pairs
– Key Features
• Acquisition modes: Sample (normal), Envelope, Average, and FrameScan™ for isolation of data-dependent failures and low-level repetitive signal examination
• Four Color Graded Variable Persistence waveform databases with color and gray-scale grading for sample density visualization
• Communications-tailored measurements: jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and RZ/NRZ amplitude measurements
• Compliance-based mask testing for SDH/SONET, Ethernet, Fibre Channel, and optical/electrical communications standards
• Advanced Jitter, Noise and BER Analysis Software (80SJNB) option available
• Modular architecture: accommodates up to six sampling modules (two large, four small)
• TDR probes and static protection modules available
– Typical Applications
• Semiconductor device and component testing
• High-speed signal characterization and protocol compliance verification
• Time Domain Reflectometry and transmission measurements
• Optical and electrical communications signal analysis
– Compatibility & Integration
Configurable with various electrical and optical sampling modules. Operates on Microsoft Windows 2000 platform.
