The Rohde & Schwarz ZNL3 is a 2-port vector network analyzer spanning 5 kHz to 3 GHz, engineered for education, development, and production environments. This compact instrument delivers up to 130 dB dynamic range and integrates VNA, spectrum analyzer (optional hardware), and RF power meter (optional external sensor support) functionality in a single platform. Measure S-parameters, impedance, admittance, and perform time domain and distance-to-fault analysis with 1 Hz frequency resolution and noise floors reaching -150 dBm typical.
Technical Specifications
Frequency & Resolution
• Frequency range: 5 kHz to 3 GHz
• Frequency resolution: 1 Hz
• IF bandwidth: 1 Hz to 500 kHz
Measurement Performance
• Dynamic range: Up to 130 dB (typical)
• Noise floor: -140 dBm/Hz specified; typical -150 dBm
• Trace noise: Less than 0.0025 dB typical at 10 kHz IFBW
• Output power: 0 dBm specified; typical +3 dBm
• Maximum input level: +15 dBm
• Third-order intercept point: >16 dBm specified; typical >22 dBm
• Phase noise (1 GHz, 10 kHz offset): <-105 dBc (1 Hz) specified; typical <-108 dBc (1 Hz)
Signal Analysis
• Maximum signal analysis bandwidth: 40 MHz (with optional spectrum analyzer)
Hardware
• Ports: 2, Type N female connectors
• Impedance: 50 Ω
• Display: 10.1" WXGA color LCD with capacitive multitouch
• Dimensions: 408 × 186 × 235 mm
• Weight: 6 kg to 7.3 kg
– Key Features
• S-parameter, wave ratio, impedance (Zxy), and admittance (Y) measurements
• Time domain analysis and distance-to-fault (DTF) capability
• Analog demodulation support
• USB host/device and LAN (RJ-45) interfaces; optional GPIB
• Battery and DC supply for field portability
• 12 V/24 V DC input for vehicle operation
– Typical Applications
Component and circuit characterization, PCB validation, cable fault location, filter and amplifier testing, antenna measurements, and educational demonstrations of RF fundamentals.
– Compatibility & Integration
Standard USB and Ethernet connectivity enable integration into automated test systems and remote operation. Optional spectrum analyzer and external power sensor support extend measurement versatility across production and development workflows.
