The Tektronix 11802 W with options 1C, 1R, 2D, and 4D is a digital sampling oscilloscope engineered for high-speed waveform acquisition and precise signal characterization. This modular instrument accepts two 11800 series sampling modules and delivers acquisition rates to 200 kHz with configurable record lengths from 512 to 5120 samples. The 8-bit vertical system provides deflection factors from 2 to 255 mV/div with ±1% gain accuracy, while the horizontal timebase spans 1 ps/div to 5 ms/div. The 1 GHz trigger bandwidth with 5 ps + 20 ppm delay jitter supports edge-triggered acquisition of low-repetition-rate signals via internal pretrigger pickoff. Integrated waveform processing includes 16 mathematical functions and 16 measurement parameters with continuous update capability.
Technical Specifications
• Maximum Sampling Rate: 200 kHz
• Record Length Options: 512, 1024, 2048, 4096, 5120 samples
• Input Channels: Two 11800 series plug-in sampling modules
• Vertical Resolution: 8 bits full screen
• Deflection Factors: 2–255 mV/div (1 mV increments); 4–510 mV/div (2 mV increments)
• Amplifier Gain Accuracy: ±1%
• Offset Range: ±2 V
• Equivalent-Time Sampling Interval: 10 femtoseconds
• Timebase Range: 1 ps/div to 5 ms/div
• Trigger Bandwidth: 1 GHz
• Trigger Sensitivity (DC Coupled): 50 mV p-p (DC–100 MHz); 150 mV p-p (to 800 MHz); 250 mV p-p (1 GHz)
• Trigger Sensitivity (AC Coupled): 50 mV p-p (10 kHz–100 MHz); 150 mV p-p (1 GHz)
• Delay Jitter: 5 ps + 20 ppm of selected delay (RMS)
• Trigger Level Range: ±1.0 V (±5.0 V with 10X attenuator)
• Internal Pretrigger Window: Up to 5 ns
– Key Features
• Modular architecture supporting specialized sampling module configurations
• Up to 8 displayed traces with independent window record positioning
• Automatic edge tracking on main record with synchronized window movement
• Waveform processing: add, subtract, multiply, divide, absolute, average, differentiate, envelope, exponent, integrate, natural log, log, signum, square root, smoothing, filter
• Measurement set: max, min, mid, p-p, mean, RMS, rise, fall, frequency, period, prop delay, cross, width, area+, area−, energy
• Mean and standard deviation available on all measurements
– Typical Applications
Complex signal analysis, high-speed transient capture, and characterization of low-repetition-rate phenomena requiring nanosecond-scale pretrigger visibility.
– Compatibility & Integration
Designed to accept 11800 series sampling modules; shares architectural characteristics with the 11801 mainframe, which supports expanded configurations with SM-11 Multi-Channel Units.
