The Tektronix 172 is a programmable test fixture that automates sequential characterization of semiconductor devices in conjunction with the Tektronix 576 Curve Tracer. It executes up to eleven pre-programmed tests without manual intervention, eliminating repetitive setup changes and standardizing measurement conditions across device batches. The fixture programmably controls test parameters, voltage and current drive ranges, and deflection factor overrides on the 576, enabling precise characterization of JFETs, transistors, and diodes.
Technical Specifications
• Programmable Tests: Up to eleven sequential tests
• Peak Drive Capability: 10 A, 500 V
• Transistor/Diode Parameters: Hfe, Vce, Iceo, Ices, Icer, Icbo, Iebo
• JFET Parameters: Vp, Idss, Rds, Igss, BVgss
• Programming Interface: 016-0198-00 programming cards and 214-1633-00 programming pins
– Key Features
• Automatic or manual test sequencing with variable rate control
• Front-panel switch or optional foot switch for manual advance
• Programmable override of 576 Curve Tracer deflection factors
• Standardized test conditions reduce setup time and improve measurement repeatability
– Typical Applications
Characterization of discrete semiconductors in production, incoming inspection, and design validation workflows. Batch testing of matched device pairs and parameter trending across process conditions.
– Compatibility & Integration
Designed for direct integration with the Tektronix 576 Curve Tracer. Accepts 016-0198-00 programming cards and 214-1633-00 programming pins for flexible test configuration.
