The Tektronix 2630 is a spectrum analyzer built for RF and microwave measurements across 9 kHz to 3.2 GHz. It employs a triple superhet receiver architecture and synthesized local oscillator to deliver stable, accurate frequency characterization. The instrument covers an amplitude dynamic range of 80 dB (113 dB with attenuation) and supports both logarithmic and linear display modes on a CRT. Configurable resolution bandwidth spans 300 Hz to 5 MHz, enabling detailed signal analysis from broadband surveys to narrowband investigations.
Technical Specifications
• Frequency range: 9 kHz to 3.2 GHz
• Resolution bandwidth: 300 Hz to 5 MHz (user-configurable)
• Amplitude measurement range: −100 dBm to +13 dBm
• Reference level: −27 dBm to +13 dBm (10 dB steps)
• Output attenuator: 0 to 40 dB (four 10 dB steps)
• Dynamic range: 80 dB standard; 113 dB with attenuation
• Frequency stability: 150 kHz/hour
• Input impedance: 50 Ω
• Input connector: BNC
• Output probe power: 6 V
– Key Features
• Synthesized local oscillator ensures measurement precision
• Comprehensive marker functions for signal characterization
• Tracking generator (selected models): 0.1 to 1050 MHz
• AM and FM demodulation capability
• Front-panel BNC inputs (CH1–CH4): 1 MΩ; 200 pF; ±30 V maximum
• Signal generator output: 50 Ω; ±10 V; separate BNC connector
• System interconnect DB9 connector for external triggering and external sampling (TTL-level)
• Serial port for host computer integration
– Typical Applications
• EMI pre-compliance testing during development cycles
• RF leakage and radiation surveys
• CATV/MATV system diagnostics
• Cellular and pager RF characterization
• Spectrum monitoring and interference hunting
• Radiolocation and electronic warfare analysis
• General-purpose RF spectrum analysis
– Compatibility & Integration
The Tektronix 2630 integrates with the optional PR-261 near-field sniffer probe set for locating emissions on cables and PCBs. External triggering and sampling inputs via the system interconnect connector enable automated test sequences and synchronized measurements with external instruments.
