The Tektronix P3410 is a TTL logic level output pod designed to expand the capability of Tektronix DG2020 and DG2020A data generators. It enables precise digital signal generation and output characterization across 12 independent channels, supporting data rates up to 1.1 Gbps with pattern depths to 256 K per channel. The pod delivers configurable output voltage levels from -2.0 V to +7.0 V (high) and -3.0 V to +6.0 V (low) into 1 MΩ loads, with 0.1 V resolution and output swing capability from 0.5 Vp-p to 9.0 Vp-p maximum. Engineers and technicians in digital design, system integration, and laboratory signal analysis use the P3410 to generate deterministic test patterns and validate circuit behavior under controlled conditions.
Technical Specifications
• Channels: 12
• Data Rate: Up to 1.1 Gbps
• Pattern Depth: Up to 256 K per channel
• Output Voltage High (VOH): -2.0 V to +7.0 V (into 1 MΩ)
• Output Voltage Low (VOL): -3.0 V to +6.0 V (into 1 MΩ)
• Voltage Resolution: 0.1 V
• Output Swing Range: 0.5 Vp-p to 9.0 Vp-p
• Total Output Current: <500 mA
• Sink Current: +30 mA per channel – Key Features • TTL logic level output with fixed voltage levels
• 12 independent output channels for parallel digital signal generation
• Wide output voltage range supports multiple logic families and test scenarios
• High data rates (1.1 Gbps) for timing-critical applications
• Deep pattern memory (256 K) enables complex test sequences
• Pin header-to-pin header cable interface included – Typical Applications • Digital design verification and validation
• System integration testing
• Logic circuit characterization
• Multi-channel digital stimulus generation – Compatibility & Integration The P3410 connects directly to Tektronix DG2020 or DG2020A data generators via rear panel connectors using 012-1502-XX series cables. Proper cable orientation – with yellow index mark aligned and tab slot positioned upward – is essential to prevent equipment damage. Complete operational and installation guidance is available in user manual 070A65650.
