The Tektronix TDS784A is a four-channel digital oscilloscope delivering 1 GHz analog bandwidth and up to 4 GS/s real-time sample rate. Purpose-built for electronics design verification and troubleshooting, it captures transient anomalies and rapidly evolving signals through InstaVu™ acquisition technology exceeding 400,000 waveforms per second. The instrument provides eight standard triggering modes—edge, pulse width, runt, slew rate, logic pattern, state, setup & hold violation, and optional HDTV video triggering—with configurable main trigger modes (Auto, Normal, Single) and delayed trigger options by time, events, or combined criteria.
Technical Specifications
Bandwidth & Sampling
• Analog bandwidth: 1 GHz
• Real-time sample rates: 4 GS/s (1 channel), 2 GS/s (2 channels), 1 GS/s (3–4 channels)
• Record length: 50,000 samples standard; Option 1M extends to 500,000 samples (1 channel), 250,000 samples (2 channels), 130,000 samples (3–4 channels)
Vertical System
• Sensitivity: 1 mV/div to 10 V/div
• DC gain accuracy: ±1.0%
• Vertical resolution: 8-bit standard (256 levels); 13-bit in Hi-Res acquisition; 11-bit in averaging mode
• Input impedance: 1 MΩ || 10 pF or 50 Ω (AC/DC coupling)
• Maximum input voltage: ±400 V (DC + peak AC)
• Channel isolation: >100:1 at 100 MHz; >30:1 at bandwidth
Time Base
• Range: 200 ps/div to 10 s/div (main and delayed)
• Accuracy: ±25 ppm over intervals ≥1 ms
• Interchannel delay: <50 ps (equal V/div and coupling); 400,000 wfms/sec), FastFrame™, Sample, Envelope, Average, Hi-Res, Peak Detect, Infinite Persistence, Variable Persistence
• Automatic measurements: 25 functions on full record or gated region
• Measurement accuracy: <38 ps typical @ 4 GS/s
• Cursor measurements: Absolute/Delta; volts/time
– Key Features
• Pulse width triggering: 1 ns to 1 s range
• Peak Detect mode captures 1 ns glitches
• Step response accuracy: ≤0.5% error within 20 ns of ≤2 V step
• AC coupled low-frequency limits: ≤10 Hz (1 MΩ); ≤200 kHz (50 Ω)
– Typical Applications
Electronics design and verification, signal anomaly capture, transient analysis, high-speed digital circuit troubleshooting.
