The Xantrex XPF35-10 is a programmable dual-output DC power supply engineered for laboratory testing, product development, and automated test systems. Built on switch-mode technology with PowerFlex design, it delivers independent, isolated outputs configurable in series or parallel for voltage or current multiplication. Two 4-digit LED meters (10 mV and 10 mA resolution) provide real-time voltage and current feedback at 4 Hz read rate. Remote programming enables automated control via coarse/fine voltage adjustment and logarithmic current limiting.
Technical Specifications
Output Ratings (Per Output)
• Voltage: 0–35 V
• Current: 0–10 A (within power envelope)
• Maximum Power: 175 W per output
Power Envelope
Current delivery varies with voltage setting. At 35 V, maximum current is 5 A; at 12 V and below, 10 A is available. The combined power limit of 350 W across both outputs applies.
Regulation & Stability
• Line Regulation: <0.01% of maximum output (±10% input variation)
• Load Regulation: <0.05% of maximum output (90% load change)
• Output Ripple & Noise: 5 mV rms typical, 2 mV rms (20 MHz bandwidth), <20 mV peak-peak with both outputs loaded at 7 A @ 25 V in CV mode
• Output Impedance: 5 kΩ (constant current mode)
Protection
• Over-Voltage Protection: 10–110% of maximum output voltage, 50 V terminal maximum
• Reverse Current Protection: Diode clamp rated to 3 A
Meter Accuracy
• Voltage: ±0.2% ±1 digit
• Current: ±0.5% ±1 digit
AC Input & Power
• Input: 110–120 V AC or 220–240 V AC ±10% (factory-selectable; option HV available)
• Frequency: 50/60 Hz
• Power Consumption: 600 VA maximum
• Installation Category: II
– Key Features
• Dual independent, isolated outputs—series or parallel wiring for doubled voltage (70 V) or current (20 A)
• Low-noise output suitable for sensitive analog circuits
• Meter resolution of 10 mV and 10 mA for precision monitoring
• Programmable voltage and current for integration with ATE systems
– Physical
• Dimensions: 8.3″ W × 5.1″ H (210 mm × 130 mm)
– Typical Applications
• Benchtop laboratory power sourcing
• Automated test system integration
• Transducer and sensor excitation
• Component burn-in and characterization
