The Yokogawa AQ6375E is a high-performance optical spectrum analyzer delivering precise spectral measurements across the 1200–2400 nm wavelength range. Engineered for telecommunications, optical device characterization, and production environments, it combines superior resolution, extended dynamic range, and rapid sweep capability to provide detailed analysis of optical signals in the extended near-infrared spectrum. The instrument measures spectral amplitude from –70 dBm to +20 dBm with ±0.5 dB accuracy at 1550 nm, achieving more than 50 dB dynamic range at 0.1 nm resolution. Its selectable resolution bandwidths span 0.05 nm to 10 nm, supporting wavelength accuracy of ±0.1 nm (1500–1700 nm) and ±0.2 nm (1200–1500 nm, 1700–2400 nm). With minimum sweep times of 0.2 seconds over 50 nm ranges and full-featured analysis functions, the AQ6375E enables rapid characterization of lasers, optical amplifiers, filters, and passive components.
Technical Specifications
• Wavelength Range: 1200 nm to 2400 nm
• Wavelength Accuracy: ±0.1 nm (1500–1700 nm); ±0.2 nm (1200–1500 nm, 1700–2400 nm)
• Wavelength Resolution: 0.05 nm minimum (typical); selectable 0.05 nm to 10 nm
• Level Measurement Range: –70 dBm to +20 dBm
• Level Accuracy: ±0.5 dB @ 1550 nm
• Dynamic Range: >50 dB (peak to noise floor @ 1550 nm, 0.1 nm resolution)
• Optical Input: FC/APC connector; +23 dBm maximum input power
• Minimum Sweep Time: 0.2 seconds (50 nm range)
• Dimensions: 425 mm (W) × 195 mm (H) × 450 mm (D)
• Weight: 22 kg (approx.)
• Power Supply: 100–240 VAC, 50/60 Hz; 300 VA maximum
– Key Features
• Peak search, level measurement, and wavelength measurement functions
• Spectrum averaging and noise level measurement
• Threshold setting and pass/fail testing capability
• Color LCD wavelength vs. level display
• External trigger and reference clock inputs/outputs
– Typical Applications
• WDM system laser and optical amplifier characterization
• Spectral purity and side-mode suppression ratio (SMSR) analysis
• Optical filter, grating, and passive component spectral measurement
• Extended near-infrared device testing and validation
– Compatibility & Integration
• USB 2.0 (Type A and Mini-B) for data transfer and instrument control
• Ethernet 10/100/1000 Base-T for remote access
• GPIB (IEEE 488.2) for remote control
