The Yokogawa AQ6376E is a bench-top optical spectrum analyzer covering 1500–3400 nm, extending into the Mid-Wave Infrared region. It delivers high-accuracy wavelength measurements, exceptional sensitivity down to −65 dBm, and a 78 dB measurement dynamic range. The instrument supports both free-space and fiber-coupled inputs (single-mode and multimode up to 400 µm) and executes full-span sweeps in as little as 0.5 seconds using Double Speed Mode. Built-in gas purging, cut filtering, and fast auto-calibration eliminate common measurement artifacts. Advanced Pulsed Light Measurement capability and a double-pass monochromator design enable precise characterization of environmental gases (COx, NOx, CxHy), laser sources, and infrared optical components in R&D and manufacturing environments.
Technical Specifications
• Wavelength range: 1500–3400 nm
• Wavelength accuracy: ±0.5 nm
• Wavelength resolution: 0.1 nm
• Close-in dynamic range: 55 dB
• Measurement dynamic range: 78 dB
• Level sensitivity: −65 dBm
• Optical input: Free-space and fiber-coupled (single-mode, multimode to 400 µm)
• Sweep time: 0.5 seconds minimum (100 nm span, Double Speed Mode)
• Double-pass monochromator for high resolution and dynamic range
– Key Features
• Double Speed Mode for up to 2× faster sweep performance
• Advanced Pulsed Light Measurement (APLM) mode
• Gas purging ports to reduce water vapor absorption
• Built-in cut filter for high-order diffraction suppression
• Fast auto-calibration with internal reference source (<2 minutes)
• 55 dB close-in dynamic range for signal separation
• Large touchscreen display for intuitive operation
• Built-in parameter analysis for automatic device characterization
• Ethernet interface for high-speed data transfer
– Typical Applications
• Environmental gas sensing and monitoring (COx, NOx, hydrocarbons)
• Laser spectroscopy and source characterization
• Optical device and component testing in the infrared
• Manufacturing quality assurance for infrared optical systems
– Compatibility & Integration
Accepts single-mode and multimode fiber inputs up to 400 µm diameter. Supports external reference sources for wavelength calibration. Ethernet connectivity enables rapid remote measurement and data logging.
