The Agilent/Keysight 86145B is a portable optical spectrum analyzer engineered for field deployment without sacrificing benchtop performance. Weighing 31 lbs with a 12.8″ × 16.8″ footprint, it delivers precise power and wavelength measurements across the 600–1700 nm range. The instrument excels in 50 GHz and wider WDM applications, where channel discrimination and spectral purity analysis are mission-critical.
Technical Specifications
Wavelength Coverage & Accuracy
• Measurement range: 600 nm to 1700 nm
• Span capability: 0.2 nm to full range; zero span supported
• Wavelength accuracy after internal calibration: ±0.025 nm (1510–1570 nm), ±0.035 nm (1570–1640 nm)
• User calibration accuracy: ±0.05 nm (within ±40 nm of signal), ±0.2 nm (full range)
• Absolute accuracy (2-year factory cycle): ±0.5 nm
• Reproducibility (≤1 min): ±0.003 nm; tuning repeatability: ±0.003 nm
• Enhanced accuracy with internal gas cell: ±10 pm (1480–1565 nm)
Resolution & Dynamic Range
• Selectable resolution bandwidth (FWHM): 0.06 nm, 0.1 nm, 0.2 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm
• RBW accuracy: ±4% (≥0.5 nm), ±6% (0.2 nm), ±12% (0.1 nm) in 1525–1610 nm region
• Dynamic range at 0.5 nm offset: –70 dB; chop mode (1250–1610 nm): –70 dB
• Offset-dependent: –60 dB (±0.8 nm), –58 dB (±0.5 nm), –55 dB (±0.4 nm), –40 dB (±0.2 nm) at 1550 nm
Power Measurement
• Amplitude accuracy at –20 dBm (1550 nm, 20–30°C): ±0.35 dB
• Safe input levels: +20 dBm maximum; +15 dBm per channel (1525–1700 nm), +30 dBm total
• Scale fidelity: ±0.07 dB (autorange off), ±0.05 dB (≤0 dBm inputs, characteristic)
• Amplitude stability (1 minute): ±0.01 dB; flatness (1290–1330 nm): ±0.2 dB
• Polarization dependence (1310 nm): ±0.25 dB
Sweep Performance
• Maximum sweep rate: 40 nm/50 ms
• Zero-span sampling: 50 µs per trace point
• Sweep cycles: <180 ms (50 nm span, auto zero off), <340 ms (50 nm span), <400 ms (100 nm span), <650 ms (500 nm span)
– Key Features
• Built-in test applications including Amplifier Test, Source Test, and WDM Test
• Compact, field-portable architecture optimized for demanding environments
• High wavelength reproducibility and tuning stability for dense WDM systems
• Flexible resolution bandwidth selection for narrowband and broadband analysis
– Typical Applications
• WDM system commissioning and maintenance
• Optical amplifier characterization
• Light source quality verification
• Channel power and isolation measurements
