The Yokogawa DL1740E is a 4-channel digital oscilloscope with 500 MHz analog bandwidth, designed for high-speed signal acquisition and advanced waveform analysis in electronic design, testing, and troubleshooting. The instrument delivers real-time sampling at 500 MS/s in standard mode, extending to 1 GS/s in interleave mode, with an 8-bit A/D converter and maximum record length of 1 MW (interleave) or up to 8 MW for the DL1740EL variant. A 6.4-inch TFT color LCD display renders acquired waveforms with intuitive control interfaces.
Technical Specifications
Vertical System
• Analog Bandwidth: 500 MHz
• Input Coupling: AC, DC, GND
• Input Impedance: 1 MΩ ±1.0% or 50 Ω ±1.0%
• Voltage Sensitivity: 2 mV to 1 V/div (50 Ω); 2 mV to 10 V/div (1 MΩ)
• DC Mode Accuracy: ±(1.5% of 8 divisions + offset error)
• Offset Accuracy: ±(1% of setpoint + 0.2 mV) for 2–50 mV/div ranges
• Input Bandwidth Limit: 100 MHz or 20 MHz per channel
• Maximum Input: 400 V DC+AC (1 MΩ at ≤1 kHz); 5 Vrms / 10 Vpeak (50 Ω)
Horizontal System
• Sweep Time: 1 ns to 50 s/div
• Timebase Accuracy: ±0.005%
• Roll Mode: 50 ms to 50 s/div (50 ms to 5 s/div at 1 KW record)
Acquisition
• Channels: 4
• Real-time Sampling: 500 MS/s (non-interleave); 1 GS/s (interleave)
• A/D Resolution: 8-bit
• Record Length: 1 MW (interleave); up to 8 MW (DL1740EL)
• Modes: Normal, Averaging, Envelope, Box Average
• History Memory: 2048 screens (32 screens ≈1 second at 100 KW)
Trigger System
• Modes: AUTO, AUTO-LEVEL, NORMAL, SINGLE, SINGLE (N)
• Sources: CH1–CH4, LINE, EXT
• Types: Edge, A→B (N), A Delay B, OR, Pattern, Pulse Width, TV
• External Trigger: 0–100 MHz (DC coupled)
• External Clock: 40 Hz to 20 MHz
– Key Features
• Automatic waveform measurements: P-P, Max, Min, High, Low, Avg, Rms, rise/fall time, frequency, period, duty cycle, pulse count, overshoot parameters
• Dual area measurement for concurrent parameter analysis across waveform segments
• Parameter computing via dyadic operations with constants
• Cycle statistics for long-duration signal characterization
• Envelope mode for high-frequency noise observation on low-frequency signals
• Smart search functions: Edge, Serial Pattern, Parallel Pattern, Pulse Width, Auto Scroll
• Zone and parameter-based history search
– Typical Applications
• Electronic circuit design validation and debug
• High-speed digital and analog signal characterization
• Power supply and switching transient analysis
• Bus protocol monitoring (I2C, SPI)
• Signal integrity and timing measurements
