The Advantest R6245 is a dual-channel DC voltage and current source/monitor for precision semiconductor characterization and device testing. Two isolated Source Measurement Units (SMUs) enable synchronized sourcing and measurement across voltage ranges to ±220 V and current ranges to ±2 A or ±20 A, depending on module configuration. Built for R&D and production environments requiring high-accuracy DC measurements on discrete semiconductors, integrated circuits, and power devices.
Technical Specifications
Voltage and Current Sourcing
• Voltage source/measurement: ±220 V
• Current source/measurement: ±2 A (SMU220-2, 2.4 W) or ±20 A (SMU62-20, 140 W)
• Output resistance: 500 Ω max
• Maximum allowable applied voltage: ±250 V peak max
Measurement Accuracy and Resolution
• Voltage measurement accuracy: ±0.02% of reading + 120 µV
• Voltage source accuracy: ±0.16% of setting + 3.8 mV
• Current source accuracy: ±0.5% of setting + 10 µA
• Overall source accuracy: ±0.03%
• Measurement resolution: 1 µV, 10 fA (SMU220-2) or 100 pA (SMU62-20)
• Measurement range: ±620,000 columns
• High throughput: 0.8 V/µs (at current measurement ≥6 mA)
Advanced Measurement Capabilities
• 4 phenomenon output with source/sink capability
• Remote sense: up to 5 V
• Pulse measurement: 100 µs minimum pulse width
• Sweep measurement: 700 µs minimum step
• Range switching without output discontinuity
• Synchronized dual-channel measurement for device I/O characterization
• Search measurement function
Control and Interface
• GPIB interface
• Trigger link function for automatic test sequence execution
• Sequence programming for automated evaluation tests
• External analog input: ±10 V peak max with selectable gain types
• Scanner control with TTL-level output
• Trigger input/output: TTL negative pulse (10 ms min. input, ~15 ms output)
– Key Features
Dual isolated SMUs enable true 4-wire sourcing and measurement on two independent channels. Programmable pulse and sweep modes support characterization across wide parameter ranges. Range switching maintains output continuity for uninterrupted device biasing during measurements.
– Typical Applications
DC parameter extraction of bipolar transistors, MOSFETs, GaAsFETs, discrete and integrated circuits, and power semiconductor devices in research and manufacturing environments.
– Compatibility & Integration
Integrates with Advantest R7210 scanner systems and other compatible scanner platforms for multi-device test automation. GPIB control supports integration into ATE and benchtop measurement systems.
