The Agilent/HP 8509B Lightwave Polarization Analyzer measures polarization extinction ratio, degree of polarization (DOP), and Stokes parameters across the 1200–1600 nm band. Built-in 1300 nm and 1550 nm Fabry-Perot lasers enable immediate testing; external single-wavelength and swept-wavelength sources are also supported. The instrument delivers real-time polarization state monitoring via four-diode detection, displaying results on a Poincaré Sphere. Polarization-dependent loss (PDL) and polarization mode dispersion (PMD) measurements are automated—PMD resolution reaches 1 fs with compatible tunable laser sources. Measurement rates exceed 1000 polarization states per second.
Technical Specifications
Optical Performance
• Operating wavelength range: 1200 nm to 1600 nm
• Internal laser wavelengths: 1300 nm and 1550 nm
• Internal laser output power: 1310 nm (200–500 µW); 1550 nm (150–400 µW)
• Wavelength accuracy (internal lasers): ±20 nm
• Input power operating range: +16 dBm to −49 dBm or +10 dBm to −55 dBm
• Input average power damage threshold: +22 dBm or +16 dBm
• Internal path insertion loss: 8.5 dB
• Return loss (optical output): −50 dB; (external source input): 35 dB
Measurement Performance
• Average power measurement linearity: ±0.06 dB or ±0.6 dB
• Average power measurement uncertainty: ±15%
• Measurement rate: >1000 polarization states per second
• PMD resolution: 1 fs (with specific tunable laser sources)
• PDL measurement method: Jones Matrix Method
• PMD measurement methods: Jones Matrix Eigenanalysis and Wavelength-Scanning
Electrical
• Power consumption: 200 VA maximum
– Key Features
• Four-diode detection for real-time polarization monitoring
• Poincaré Sphere visualization of polarization states
• Automated PDL and PMD analysis in optical components
• Support for external source integration
• DOP measurement capability
– Typical Applications
• Single-mode and polarization-maintaining fiber characterization
• Optical isolators, switches, and modulator testing
• Laser and beamsplitter polarization analysis
• Interferometer performance assessment
• Fiber optic system development and manufacturing
• Telecommunications, sensor, and optical computing research
– Compatibility & Integration
Accepts internal sources (1300 nm and 1550 nm lasers) or external single-wavelength and swept-wavelength optical sources across the 1200–1600 nm window.
