The Agilent/Keysight 4145B is a four-channel semiconductor parameter analyzer engineered for DC characterization of devices and materials across IC design, process control, and quality assurance workflows. Each of four programmable source-monitor units (SMUs) operates independently in voltage source, current source, or common mode, sourcing voltage from 1 mV to 100 V and current from 1 pA to 100 mA. The instrument applies linear or logarithmic sweeps, measures responses at up to 150 measurements per second, and captures up to 1150 data points per test sequence.
Technical Specifications
Source-Monitor Units
• Four programmable SMUs with independent V mode (voltage source/current monitor), I mode (current source/voltage monitor), and COM mode operation
• Voltage sourcing: 1 mV to 100 V range
• Current sourcing: 1 pA to 100 mA range
• Voltage measurement resolution: 4-1/2 digits
• Current measurement resolution: 4 digits; 50 fA minimum in current monitor mode
• Current compliance accuracy: ± (1% of range + 10 pA)
• COM mode: 0 V and 105 mA current compliance
• Measurement speed: Up to 150 measurements per second
• Maximum measurement points per sequence: 1150
Display and Analysis
• Built-in 6-inch diagonal CRT with 2048 × 2048 point resolution
• Display modes: Graphics, Schmoo, List, Matrix, Time Domain
• Analysis functions include overlay comparison (STORE/RECALL), marker, interpolate, cursor, auto scale, zoom, line function, and user-defined functions
• 11 arithmetic calculation functions including LOG, EXP, and differential (∆) operations
Data Storage
• Built-in 3.5-inch microfloppy disk drive
• Storage capacity: 240 user programs or 105 measurement results per disc; 630 Kbytes per disc
– Key Features
• Four independent SMUs enable multi-device characterization and complex test protocols
• Dual-sweep capability with linear or logarithmic sourcing modes
• High-resolution femtoampere-level current measurement
• Real-time graphical display with extensive post-measurement analysis tools
– Typical Applications
• IC design and parametric testing
• Semiconductor device and material characterization
• Process control and quality assurance
• Component selection and evaluation
– Compatibility & Integration
The 4145B accepts 100 V, 120 V, 220 V (±10%), and 240 V (−10% +5%) power inputs.
