The Agilent/Keysight 6214A is a DC power supply delivering 10 W of stable, adjustable output for benchtop electronic testing and development. This single-output instrument provides independent voltage and current regulation with exceptional line and load stability, making it suitable for precision circuit characterization and device powering. The 6214A is an obsolete product no longer manufactured by Keysight Technologies, though technical support and repair services may remain available.
Technical Specifications
Output Ratings
• Voltage range: 0 to 10 Volts
• Current range: 0 to 1 A
• Power output: 10 W
Regulation & Stability
• Constant voltage mode: < 0.01% + 2 mV
• Constant current mode: < 0.02% + 2 mA
• Voltage ripple and noise (20 Hz to 20 MHz): < 1 mVrms, 1 mVp-p
• Current ripple: 3 mArms
• Load transient response: < 50 µs (±15 mV recovery, full to half load)
Accuracy & Resolution
• Programming accuracy: < 0.35% + 20 mV (voltage), < 0.35% + 20 mA (current)
• Readback accuracy: < 0.35% + 20 mV (voltage), < 0.35% + 20 mA (current)
• Meter resolution: 10 mV (voltage), 10 mA (current)
Protection
• Over voltage protection: Programmable trip levels, response < 1.5 ms (trip ≥ 3 V), < 10 ms (trip < 3 V)
• Over current protection: Programmable trip levels
• Output float voltage: ±240 Vdc
Input & Physical
• AC input: Selectable 100/115/230 Vac (±10%), 47 to 63 Hz
• Dimensions: 88.1 mm (H) × 212.3 mm (W) × 394.3 mm (L)
• Weight: 7.3 kg
– Key Features
• Dual-mode constant voltage/constant current regulation
• Low output noise for sensitive analog circuits
• Fast transient recovery for dynamic load testing
• Programmable output protection thresholds
• Safety Class I instrument with protective earth terminal
– Typical Applications
Precision circuit development, device characterization, low-voltage system testing, and laboratory power sourcing where stable, low-noise DC output is required.
– Compatibility & Integration
This instrument era typically supported analog front-panel control and may have included GPIB compatibility for automated test systems.
