The Agilent/Keysight 8702B is a Lightwave Component Analyzer that characterizes transmission and reflection properties of optical and optoelectronic devices through swept-frequency modulation of optical carriers. It performs O/E, E/O, E/E, and O/O measurements across fixed wavelengths, delivering both frequency-domain and distance-time domain analysis without the dead zones inherent to OTDR techniques.
Technical Specifications
Measurement Capabilities
• Transmission and reflection measurements on optical, optoelectronic, and electrical devices
• Swept frequency analysis from 300 kHz to 3 GHz (6 GHz optional)
• Distance-time domain analysis for reflection localization and impulse/step response observation
• Full S-parameter measurement set for forward and reverse characterization
• Network analyzer functions including bandwidth, insertion loss/gain, phase, impedance, match, and group delay
• Harmonic swept measurements for amplifier gain, 1 dB compression, and match characterization
• Rapid frequency translator testing (mixers and similar devices)
Optical and Electrical Support
• Fixed wavelength operation at 850 nm, 1300 nm, and 1550 nm via interchangeable transducers
• 50 and 75 ohm impedance support
– Key Features
• Built-in S-parameter test set for single-connection complete device characterization
• 3.5-inch floppy disk drive for instrument state, data, and calibration storage
• Parallel and serial ports for printer/plotter connectivity and user-controlled TTL I/O
• DIN keyboard support for faster data entry and remote front-panel control
• Integrated test sequencing engine for keystroke learning and automation without external computer
– Typical Applications
Fiber optic component development and manufacturing, telecommunications device characterization, photonics research, and linear electrical component analysis.
– Compatibility & Integration
Parallel and serial port interfaces support external plotters and printers. TTL I/O via parallel port enables custom automation and integration into larger measurement systems.
