The Keysight B2901B is a single-channel precision source/measure unit (SMU) delivering integrated 4-quadrant sourcing and measurement across voltage and current with exceptional resolution. This benchtop instrument sources up to ±210 V and ±3 A DC (±10.5 A pulsed), with minimum source resolution of 1 pA / 1 µV and measurement resolution down to 100 fA / 100 nV. The B2901B acquires up to 100,000 readings/second with a 20 µs minimum timing interval, enabling rapid device characterization without instrument reconfiguration.
Technical Specifications
• Output Voltage: ±210 V
• Output Current (DC): ±3 A
• Output Current (Pulse): ±10.5 A
• Source Resolution: 1 pA / 1 µV minimum
• Measurement Resolution: 100 fA / 100 nV minimum
• Sourcing & Measuring Resolution: 10 fA / 100 nV
• Measurement Speed: 100,000 readings/second maximum
• Timing Interval: 20 µs minimum (setting/digitizing)
• Waveform Outputs: Pulse, Sweep, List Sweep, Arbitrary Waveform Generation (up to 100,000 steps)
• Display: 4.3-inch color LCD with graphical and numerical modes
• Connectivity: LAN, USB, GPIB
– Key Features
• 4-quadrant operation enables concurrent sourcing and measurement without reconfiguration
• Pulsed current capability to 10.5 A for transient characterization
• Arbitrary waveform generation with up to 100,000 programmable steps
• Integrated interlock circuit for safe operation above 42 V
• SCPI command compatibility (conventional and standard) for legacy and modern test automation
• Compact benchtop form factor with intuitive graphical interface
– Typical Applications
• Semiconductor device characterization: diodes, laser diodes, LEDs, photodetectors, sensors, FETs, BJTs, ICs (analog, RFIC, MMIC)
• Passive component testing: resistors, varistors, thermistors, switches
• Material and active/passive component characterization
• Electronic device parameter extraction and curve tracing
– Compatibility & Integration
The B2901B supports GPIB, USB, and LAN interfaces for integration into automated test systems. SCPI programming enables straightforward control in both legacy and contemporary measurement architectures.
