The Agilent/Keysight DSOX3034A is a 350 MHz digital storage oscilloscope combining oscilloscope, logic analyzer, function generator, protocol analyzer, and digital voltmeter functionality in a single platform. Built on MegaZoom IV ASIC technology, it delivers 4 GSa/s sampling across four analog channels with up to 2 Mpts of standard memory, upgradable to 4 Mpts. The instrument captures signal details down to 250 ps with Peak Detect acquisition and maintains waveform update rates to 1,000,000 wfms/s.
Technical Specifications
• Bandwidth: 350 MHz (upgradable)
• Analog Channels: 4
• Digital Channels: 16 (optional MSO upgrade)
• Sampling Rate: Up to 4 GSa/s
• Memory Depth: 2 Mpts standard; 4 Mpts upgradable
• Waveform Update Rate: Up to 1,000,000 wfms/s
• Display: 8.5-inch WVGA (800 × 480) color display with capacitive touch
• Vertical Resolution: 8 bits (12 bits in High Resolution Mode)
• Input Impedance: 1 MΩ
• Maximum Input Voltage: 300 V nominal
• Rise Time: 1 ns
– Key Features
• Peak Detect acquisition mode captures glitches as narrow as 250 ps
• Averaging mode supports 2 to 65,536 selectable averages
• High Resolution Mode delivers 12-bit resolution at ≥10 µs/div (4 GSa/s) or ≥20 µs/div (2 GSa/s)
• Segmented Acquisition for efficient memory utilization
• 33 automated measurements including voltage, frequency, and time parameters
• Advanced triggering: Edge, Pulse Width, Pattern, Rise/Fall Time, Nth Edge Burst, Runt, Setup & Hold, Video, USB, and dual Serial protocols
• Parametric and mask-based triggering with hardware acceleration up to 270,000 tests/sec
• Zone Touch Triggering for signal isolation
• FFT and waveform math functions
• Display intensity gradation for enhanced signal visibility
• Dedicated search and navigation controls for event location
– Interfaces & Connectivity
• USB Host (front and rear), USB Device
• Optional: LAN, VGA, GPIB interfaces
• Supports external memory devices and Scope Connect software
– Typical Applications
General-purpose signal analysis, design debugging, protocol validation, and mixed-signal testing across analog and digital circuits.
