The Keysight N5173B EXG X-Series Microwave Analog Signal Generator is a configurable RF source spanning 9 kHz to 40 GHz, engineered for component characterization, receiver verification, and production testing. It delivers high-purity signals with stable output across manufacturing and research environments, balancing performance and cost without compromise on frequency resolution or switching speed.
Technical Specifications
Frequency Performance
• Frequency range: 9 kHz to 40 GHz (configurable by option: 9 kHz to 13 GHz, 9 kHz to 20 GHz, 9 kHz to 31.8 GHz, or 9 kHz to 40 GHz)
• Frequency resolution: 0.001 Hz
• Frequency switching speed in SCPI mode: typically ≤ 5 ms (options: ≤ 1.15 ms or < 1.65 ms)
• List/step sweep mode switching: typically ≤ 5 ms (options: ≤ 900 µs or < 1.4 ms)
• Fast frequency switching option available with speeds ≥ 1.15 ms and ±0.05% of final frequency
• Reference oscillator aging: < ±5 × 10⁻¹⁰ per day (after 30 days)
• Initial frequency calibration accuracy: ±4 × 10⁻⁸ (±40 ppb)
• Temperature stability: < ±2 × 10⁻⁸ from 20 to 30 °C
• Line voltage stability: < ±1 × 10⁻⁹ for ±10% change
• 10 MHz reference output: ≥ +4 dBm into 50 Ω load
Amplitude Capabilities
• Output power range with Option 1E1 and 1EA: +30 dBm to –130 dBm
• Output power range without Option 1E1 and 1EA: +19 dBm to –20 dBm
• Maximum output power at 20 GHz (Option 1EA): +20 dBm
• Amplitude resolution: 0.01 dB
• Level accuracy: ±0.6 dB (9 kHz to 2 GHz, ALC on); ±1.4 dB at –120 dBm with Option 1E1
• Step attenuator (Option 1E1): 0 to 115 dB in 10 dB mechanical steps
• SWR: ≤ 1.7:1 at 0 dB attenuator state up to 2 GHz; ≤ 1.4:1 above 20 to 40 GHz
Spectral Purity
• Phase noise at 10 GHz, 20 kHz offset: –101 dBc/Hz
• Phase noise at 1 GHz, 20 kHz offset: –118 dBc/Hz
– Key Features
• External frequency reference input supported
• Type-N connector option (Option 1ED) available
• Mechanical step attenuator provides precise amplitude control
• Temperature-compensated operation across extended ranges
– Typical Applications
• Component parametric testing
• Receiver verification and validation
• Production and manufacturing test
• Research laboratory measurements
