The Keysight N5244A is a 43.5 GHz PNA-X Microwave Network Analyzer delivering integrated linear and nonlinear component characterization in a single instrument. Operating from 10 MHz to 43.5 GHz with up to four ports and dual internal sources, it combines signal generation, test switching, and analysis capabilities to replace multiple standalone instruments. The system achieves 126 dB dynamic range, supports both CW and pulsed S-parameter measurements, and includes built-in bias-tees and source/receiver attenuators for active device evaluation.
Technical Specifications
• Frequency Range: 10 MHz to 43.5 GHz
• Port Configuration: 2 or 4 ports
• Internal Sources: One or two
• System Dynamic Range: 126 dB
• Receiver Dynamic Range: 129 dB
• Maximum Output Power: +13 dBm
• High Output Power: +16 dB
• Power Sweep Range: 38 dB to 41 dB
• IF Bandwidth: 15 MHz
• Data Points: Up to 32,001
• Noise Floor: −111 dBm at 10 Hz IF bandwidth
• Receiver Compression: 0.1 dB with +15 dBm input power
• Harmonic Performance: −60 dBc
• Test Port Connectors: 50 Ω, ruggedized 2.4 mm (m)
– Key Features
• Dual internal sources enable IMD, hot-S22, and high-speed swept-LO measurements
• Internal signal combiner and routing switches for flexible test configurations
• Pulsed RF measurements via internal pulse generators/modulators
• Optional noise figure measurement with source-correction technique
• Time-domain measurements available (Option 010)
• Frequency offset measurements (Option 080)
• Gain compression and intermodulation distortion characterization
• X-parameter and nonlinear waveform capability
– Typical Applications
• Active device characterization: amplifiers, mixers, frequency converters
• Conversion gain/loss measurements
• True-differential stimulus testing
• Millimeter-wave component evaluation
• Antenna testing
• Pulsed RF device analysis
– Compatibility & Integration
The N5244A accepts 2.4 mm male connectors and integrates external components via internal signal-routing switches. Multiple measurement channels (32 to 200) support complex test sequences without reconfiguration.
