The Agilent N5245A is a 50 GHz PNA-X microwave network analyzer designed for precision characterization of RF and microwave devices across 10 MHz to 50 GHz. It consolidates multiple test instruments into a single platform, reducing measurement time and station complexity. The instrument delivers 126 dB system dynamic range and 129 dB receiver dynamic range, supporting both 2-port and 4-port configurations with dual internal sources. Advanced measurement modes include S-parameters (CW and pulsed), noise figure, gain compression, intermodulation distortion, X-parameter characterization, and pulsed-RF analysis with narrowband detection that improves dynamic range by 40 dB for pulses narrower than 267 ns.
Technical Specifications
• Frequency Range: 10 MHz to 50 GHz
• Port Configurations: 2-port and 4-port available
• System Dynamic Range: 126 dB
• Receiver Dynamic Range: 129 dB
• Direct Access Input Dynamic Range: 124 dBm
• Output Power: +16 dBm (high); +13 dBm (maximum)
• Power Sweep Range: 41 dB
• Harmonics: −60 dBc
• Noise Floor: −111 dBm at 10 Hz IF bandwidth
• IF Bandwidth: 15 MHz and 5 MHz selectable
• Measurement Points: 32,001 maximum
• Channels: 200 or 32 channel configurations
• Dynamic Accuracy: 0.1 dB compression at +15 dBm input; <0.05 dB with pulsed-RF receiver leveling
• Weight: 50 lbs
– Key Features
• Dual built-in sources with internal second source, combiner, and mechanical switches (Option 224)
• Option H85 removes bias tees, extending maximum port input power to +43 dBm
• Narrowband detection for pulsed measurements yields 40 dB dynamic range improvement versus conventional PNA systems
• Extended dynamic range at direct access input
• Vector and scalar calibrated converter measurements (Option 083)
• Time domain measurements (Option 010)
– Typical Applications
• Nonlinear characterization and X-parameter measurement
• Pulsed S-parameters, gain compression, and swept-frequency intermodulation distortion
• Conversion gain/loss analysis
• True-differential stimulus testing
• Antenna characterization
• Millimeter-wave measurements with appropriate modules
– Compatibility & Integration
• USB interfaces for remote control and data transfer
• 50 ohm ruggedized test port connectors
